- 标题
- 摘要
- 关键词
- 实验方案
- 产品
-
Formation and Evolution of Ultrathin Silica Polymorphs on Ru(0001) Studied with Combined in Situ, Real-Time Methods
摘要: Silica mono- and bilayer films on Ru(0001) can be physisorbed or chemisorbed, with ordered or vitreous structures, depending on the particular preparation procedures applied. Using the SMART spectro-microscope at BESSY-II with its capabilities for μ-spectroscopy, μ-diffraction, and LEEM imaging with lateral resolution below 5 nm, in situ and in real time and applied to identical areas, we have investigated the formation of these layers, defined and characterized their properties and their connected morphology, and followed their evolution. Two distinct chemisorbed monolayers and three bilayers (physisorbed crystalline and vitreous, and chemisorbed zigzag phases), and some transitions between them, have been studied. We found that, apart from the deposited silicon amount, the most important parameter for steering the evolution to a particular well-defined layer is the oxygen content at the Ru interface. Nucleation and growth of all layers are homogeneous on the scale of our resolution, leading to rather small domains (20 – 40 nm), mostly of the same phase, separated by defect lines. We discuss these and other basic findings in context and point out open questions. We also offer alternative recipes for the preparation of some phases, to obtain more homogeneous layers on a mesoscopic scale.
关键词: Silica films,SMART spectro-microscope,real-time methods,in situ,LEEM,chemisorbed,physisorbed,polymorphs,Ru(0001),μ-spectroscopy,μ-diffraction
更新于2025-09-04 15:30:14
-
Layer-by-Layer Graphene Growth on <i>β</i> -SiC/Si(001)
摘要: The mechanism of few-layer graphene growth on the technologically-relevant cubic-SiC/Si(001) substrate is uncovered using high-resolution core-level and angle-resolved photoelectron spectroscopy, low-energy electron microscopy, and micro-spot low-energy electron diffraction. The thickness of the graphitic overlayer supported on the silicon carbide substrate and related changes in the surface structure are precisely controlled by monitoring the progress of the surface graphitization in-situ during high-temperature graphene synthesis, using a combination of micro-spectroscopic techniques. The experimental data reveal gradual changes in the preferential graphene lattice orientations at the initial stages of the few-layer graphene growth on SiC(001) and can act as reference data for controllable growth of single-, double-, and triple-layer graphene on silicon carbide substrates.
关键词: LEEM,ARPES,μ-LEED,β-SiC,XPS,nanodomains,graphene
更新于2025-09-04 15:30:14