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Application of Nanostructured Tungsten Fabricated by Helium Plasma Irradiation for Photoinduced Decolorization of Methylene Blue
摘要： The dendritic nanostructure was fabricated on a surface of tungsten plate by helium plasma irradiation. The nanostructure consisting of W metal was partially oxidized to form WO3 on exposure to air, and the resulting surface exhibited a broad photoabsorption in the range from 1 to 5 eV. We examined photoinduced reaction of methylene blue (MB) on the material. It was found that the partially and fully oxidized surface nanostructures were able to promote a decolorization of MB under photoirradiation even with the near-infrared light (< 1:55 eV), whose energy is lower than the band gap of WO3. The reaction rate was varied with the fraction of W and WO3 on the surface layers, that is, the partially oxidized sample promoted the reaction at a higher rate than the fully oxidized one. It is also found that the reaction rate decreased with time, which would be caused by the products accumulation on the surface and the surface oxidation.
关键词： Scanning electron microscopy (SEM),Tungsten oxide,Surface photochemistry,Plasma processing,Nano-wires, quantum wires, and nanotubes,Visible/ultraviolet absorption spectroscopy, X-ray photoelectron spectroscopy
更新于2025-09-23 15:21:01
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Dry Magnetic Separation on the Recovery of Metal Fragments from Kerf Slurry Waste Produced during the Manufacture of Photovoltaic Solar Cells
摘要： In the interest of reducing the cost of photovoltaic production while preserving the environment, a sawing rejection treatment was carried out by recovering the metals with an efficiency estimated to be 96%. To achieve this outcome, first, the sawing rejection was washed with acetone to dissolve the polyethylene glycol. It was then dried in an oven at 70 °C to obtain a slurry powder. This later, powder has undergone a dry magnetic separation under different electric current intensity to recover metals. The metal-containing phase has been characterized by the X-ray diffractometer and the scanning electron microscope. Finally, a simulation on the recovery of metal fragments in the slurry generated during the manufacture of photovoltaic briquettes.
关键词： Metals,Slurry,Dry magnetic separation,Photovoltaic cell,Polyethylene glycol (PEG),Scanning electron microscopy (SEM)
更新于2025-09-23 15:19:57
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Studies on structural, surface morphology and optical properties of Zinc sulphide (ZnS) thin films prepared by chemical bath deposition
摘要： Zinc sulphide (ZnS) thin films have been prepared by chemical bath deposition method. X-ray diffraction (XRD) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the particle size and morphology of ZnS thin film. Optical studies have been carried out using UV-Visible-NIR absorbance spectrum. The band gap value of the film is calculated and it is found to be 3.45 eV. The dielectric properties of ZnS thin films have been studied in the different frequency at different temperatures.
关键词： scanning electron microscopy (SEM),Zinc sulphide (ZnS) thin films,dielectric studies,X-ray diffraction (XRD)
更新于2025-09-23 15:19:57
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The Effects of Laser Parameters and the Ablation Mechanism in Laser Ablation of C/SiC Composite
摘要： The e?ects of laser parameters and the ablation mechanism in laser ablation of a carbon ?ber reinforced silicon carbide (C/SiC) composite are investigated in the present study. Six di?erent power densities are provided, as well as six levels of pulse numbers, and then ablation experiments are conducted for the C/SiC composite, induced by a pulsed laser. Based on the experimental results, the characteristics of surface morphology and ablation behavior are discussed. It is revealed that the surface morphology of the C/SiC composite under laser irradiation usually includes three regions: the center region, the transition region, and the border region. With the increase of laser power density, the ablation of the center region becomes severe, surface cracks occur, and more spherical SiC particles are found in the transition region. As for scenarios involving multiple pulses, the damage occurs in the center region at low power density limits, within the ?rst two layers below the surface. However, if the power density is relatively high, an ablation pit occurs in the center region when the pulse number is larger than 50. Meanwhile, the transition region and the border region diminish with increase of the pulse number. It is noted that both the power density and pulse number have noticeable e?ects on surface morphology and ablation behavior during laser ablation, which is helpful for material design and performance evaluation of C/SiC composites.
关键词： Surface morphology,C/SiC composite,Ablation mechanism,Laser ablation,Scanning electron microscopy (SEM)
更新于2025-09-12 10:27:22
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Micron-Sized Constrictions Fabricated Using the Femtosecond Laser Technique on YBCO Thin Films
摘要： In this paper, I report on the fabrication of micron-sized constrictions in YBCO thin films using the femtosecond laser technique. The constrictions are S-shaped superconducting weak links fabricated on YBCO thin films. The constrictions show a measurable superconducting current flowing through them. Current-voltage (I–V) characteristics were used to determine the critical current IC of the constrictions at 77 K. The width of the constrictions was determined at the narrowest point using SEM (scanning electron microscope). Three micron-sized constrictions were fabricated with a width of 2.88 μm, 1.72 μm, and 1.69 μm and a length of 5 μm. Based on the width and length of these constrictions in relation to the coherence length (ξ) of the YBCO, these constrictions should conduct supercurrent by Abrikosov vortices. The SEM images show that the femtosecond laser heats the samples beyond the geometric boundary, damaging some of the superconductive phases of the YBCO constrictions. As a result, the constrictions conduct current by one-dimensional depairing.
关键词： Atomic force microscope (AFM),Abrikosov vortices,Flux pinning,YBCO thin film,Lasers,Critical currents,Scanning electron microscopy (SEM)
更新于2025-09-11 14:15:04
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Determination of Sulfite in Botanical Medicine Using Headspace Thin-Film Microextraction and Surface Enhanced Raman Spectrometry
摘要： A facile method using headspace thin-film microextraction (HS-TFME) coupled with surface enhanced Raman spectrometry (SERS) has been developed for the determination of sulfite in traditional Chinese herbal medicine. The extraction substrate was synthesized by depositing urchin-like ZnO micron particles on glass sheets using chemical liquid phase deposition. Under the optimal conditions, the intensity of the SERS signal at 630–640 cm?1 provided a good linear relationship with the concentration of sulfite from 25 to 400 mg/kg, and the linear correlation coefficient (R) was 0.996 with a detection limit of 6 mg/kg. The method was employed for the determination of sulfite in herbal medicines, and the results were confirmed by a traditional distillation-titration method. Therefore, this developed HS-TFME-SERS method may play an important role in the rapid, simple, and selective determination of sulfite residues in Chinese herbal medicine and become a potentially universal method for this analyte in various solid samples.
关键词： Headspace thin-film microextraction (HS-TFME),scanning electron microscopy (SEM),X-ray diffraction (XRD),surface enhanced Raman spectrometry (SERS),transmission electron microscopy (TEM)
更新于2025-09-10 09:29:36
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From EBIC images to qualitative minority carrier diffusion length maps
摘要： A novel method is presented with the aim to perform minority carrier di?usion length map on cross-sectional samples. The method is based on one Electron-Beam Induced Current (EBIC) acquisition and on the analyze of the EBIC signal slope variation on each scanned points. This method is applied on a pinned photodiode array realized on a low doped silicon epitaxy, and the electron di?usion length map which is extracted is in good accordance with our expectation taking into account the doping distribution of the device. A TCAD simulation also con?rms quantitatively the measured di?usion length map. Advantages and drawbacks of this method are discussed in this study.
关键词： CMOS image sensors,CMOS,Scanning electron microscopy (SEM),Simulation,Electron-beam-induced current (EBIC),Deep submicron process,Solid-state image sensor,Semiconductor material measurements
更新于2025-09-10 09:29:36
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Effect of Sputtering Technique and Properties of TiO2 Doped with SnO2 Thin Films
摘要： Doped oxide materials of 90% of TiO2 was doped with 10% of SnO2 that target has been deposited at a substrate temperature of 250°C for 1 hour by using DC Sputtering technique. The as synthesized target was TiO2-SnO2 was used to deposit on the glass substrates. The deposited oxide thin film was characterized for their structural, surface morphological, electrical and optical properties. X-ray diffraction is used for studying the nature and structure, scanning electron, atomic force microscopy and transmission electron microscopy are used to identify the surface morphology of the prepared films. The Van der Pauw technique is employed to measure electrical resistivity and Hall mobility of the film. Wide varieties of methods are available for measuring thin film thicknesses. Stylus profilometry will be helpful to find the thickness of the film, structural studies by X-ray, and micros structural analysis of the film.
关键词： Scanning Electron microscopy (SEM),Stylus profilometry,TiO2-SnO2,X-ray diffraction (XRD),UV-Vis-NIR spectrometer
更新于2025-09-04 15:30:14