Quantifying Photocurrent Loss of a Single Particle–Particle Interface in Nanostructured Photoelectrodes

摘要： Particle?particle interfaces are ubiquitous in nanostructured photoelectrodes and photovoltaics, which are important devices for solar energy conversion. These interfaces are expected to cause performance losses in these devices, but how much loss they would incur is poorly defined. Here we use a subparticle photoelectrochemical microscopy approach in combination with specific photocurrent measurement electrode configurations to quantify the current losses from single particle?particle interfaces formed between individual TiO2 nanorods operating as photoanodes in aqueous electrolytes. We find that a single interface leads to ～20% photocurrent loss (i.e., ～80% retention of the original current). Such quantitative, first-of-its-kind, information provides a metric for guiding the optimization and design of nanostructured photoelectrodes and photovoltaics.