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oe1(光电查) - 科学论文

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  • Portable, visual, and nondestructive detector integrating Vis/NIR spectrometer for sugar content of kiwifruits

    摘要： A portable sugar content detector for intact kiwifruits was developed using a visible/near-infrared spectrometer over the wavelength of 350–1,100 nm as spectra collector, a tablet computer as controller, a micro-halogen lamp as light source, and a self-made “Y” shape optical fiber as light transmitter and light receiver. The software applied to collect spectra, to establish sugar content prediction model, and to predict sugar content of kiwifruits was developed by Java language. Partial least square regression model was established to determine sugar content of kiwifruits. Contrasted with the sugar content obtained by digital refractometer, the root-mean-square error of the developed detector was 0.93% in soluble solids content. The obtained sugar content using the developed detector could be given in 2.5 s. The study shows that the developed portable sugar content detector is a promising tool for on-site or in field nondestructive measurement on sugar content of kiwifruits.

    关键词： kiwifruits,portable detector,Vis/NIR spectrometer,nondestructive measurement,sugar content

    更新于2025-09-23 15:23:52

  • Effect of Sputtering Technique and Properties of TiO2 Doped with SnO2 Thin Films

    摘要： Doped oxide materials of 90% of TiO2 was doped with 10% of SnO2 that target has been deposited at a substrate temperature of 250°C for 1 hour by using DC Sputtering technique. The as synthesized target was TiO2-SnO2 was used to deposit on the glass substrates. The deposited oxide thin film was characterized for their structural, surface morphological, electrical and optical properties. X-ray diffraction is used for studying the nature and structure, scanning electron, atomic force microscopy and transmission electron microscopy are used to identify the surface morphology of the prepared films. The Van der Pauw technique is employed to measure electrical resistivity and Hall mobility of the film. Wide varieties of methods are available for measuring thin film thicknesses. Stylus profilometry will be helpful to find the thickness of the film, structural studies by X-ray, and micros structural analysis of the film.

    关键词： Scanning Electron microscopy (SEM),Stylus profilometry,TiO2-SnO2,X-ray diffraction (XRD),UV-Vis-NIR spectrometer

    更新于2025-09-04 15:30:14