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Building Intermixed Donor-Acceptor Architectures for Water-Processable Organic Photovoltaics
摘要： A modified synthesis method for aqueous nanoparticle printing inks, based upon vacuum-assisted solvent removal, is reported. Poly(3-hexylthiophene) : phenyl C61 butyric acid methyl ester nanoparticle inks were prepared via this modified miniemulsion method; leading to both an improvement in photoactive layer morphology and a substantial reduction in the ink fabrication time. A combination of UV-visible spectroscopy, photoluminescence spectroscopy and scanning transmission X-ray microscopy measurements revealed a nanoparticle morphology comprised of highly intermixed donor-acceptor domains. Consistent with these measurements, dynamic mechanical thermal analysis of the nanoparticles showed a glass transition temperature (Tg) of 104 °C, rather than a pure polymer phase or pure fullerene phase Tg. Together the spectroscopy, microscopy and thermomechanical data indicate that rapid solvent removal generates a more blended nanoparticle morphology. As such, this study highlights a new experimental lever for optimising nanostructure in the photoactive layer of nanoparticulate organic photovoltaic devices by enabling highly intermixed donor-acceptor architectures to be built from customised nanoparticulate inks.
关键词： organic photovoltaic,scanning transmission X-ray microscopy,morphology,colloidal inks,exciton dissociation,Nanostructure,eco-friendly processing
更新于2025-11-19 16:46:39
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Coherent Tabletop EUV Ptychography of Nanopatterns
摘要： Coherent diffraction imaging (CDI) or lensless X-ray microscopy has become of great interest for high spatial resolution imaging of, e.g., nanostructures and biological specimens. There is no optics required in between an object and a detector, because the object can be fully recovered from its far-field diffraction pattern with an iterative phase retrieval algorithm. Hence, in principle, a sub-wavelength spatial resolution could be achieved in a high-numerical aperture configuration. With the advances of ultrafast laser technology, high photon flux tabletop Extreme Ultraviolet (EUV) sources based on the high-order harmonic generation (HHG) have become available to small-scale laboratories. In this study, we report on a newly established high photon flux and highly monochromatic 30 nm HHG beamline. Furthermore, we applied ptychography, a scanning CDI version, to probe a nearly periodic nanopattern with the tabletop EUV source. A wide-field view of about 15 × 15 μm was probed with a 2.5 μm?diameter illumination beam at 30 nm. From a set of hundreds of far-field diffraction patterns recorded for different adjacent positions of the object, both the object and the illumination beams were successfully reconstructed with the extended ptychographical iterative engine. By investigating the phase retrieval transfer function, a diffraction-limited resolution of reconstruction of about 32 nm is obtained.
关键词： high-order harmonic generation,ptychography,lensless X-ray microscopy,Extreme Ultraviolet,Coherent diffraction imaging
更新于2025-09-23 15:21:21
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Three Dimensional Imaging of Biological Samples and Nano-materials Using Soft X-ray Microscopy
摘要： The soft X-ray Microscopy beamline BL07W at National Synchrotron Radiation Laboratory is devoted to cryo nano-tomography for biological applications in the water window (284 - 530 eV) and for imaging of nanomaterials from 200 to 2500 eV. An ellipsoidal capillary used as condense to focus monochromatic light onto the sample. Two Ni zone plate (ZP) lenses made by Zeiss with 40 nm and 25 nm outer most zone widths, respectively, are available, giving spatial resolution in 2D of down to 40 nm and 30 nm, respectively. Hydrated biological specimens had been imaged in the water window photon energy range without chemical fixation, dehydration, chemical staining and physical sectioning. In addition, other applications such as nanomaterials imaging had been demonstrated.
关键词： cryo nano-tomography,Soft X-ray Microscopy,nanomaterials imaging,water window
更新于2025-09-23 15:21:01
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Hard X-ray imaging microscopy with self-imaging phenomenon
摘要： The self-imaging phenomenon referred to as the Talbot effect in the field of optics was discovered by H.F. Talbot in the 1830s, and is now widely used for imaging using not only visible light but also X-rays, electrons, neutrons, and matter waves. In this review, the author introduces the current progress being made in hard-X-ray imaging microscopy based on the self-imaging phenomenon. Hard-X-ray imaging microscopy is a promising technique for non-destructively visualizing internal structures in specimens with a spatial resolution up to a few tens of nanometers. The use of the self-imaging phenomenon makes it possible to realize highly sensitive phase-contrast X-ray imaging microscopes. These approaches have several advantages over conventional X-ray imaging microscopes, including the widely used Zernike X-ray phase-contrast microscopes, and can provide a powerful way of quantitative visualization with a high spatial resolution and a high sensitivity even for thick specimens.
关键词： grating,Talbot effect,interferometry,X-ray imaging,X-ray microscopy
更新于2025-09-19 17:15:36
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Strain Mapping of CdTe Grains in Photovoltaic Devices
摘要： Strain within grains and at grain boundaries (GBs) in polycrystalline thin-film absorber layers limits the overall performance because of higher defect concentrations and band fluctuations. However, the nanoscale strain distribution in operational devices is not easily accessible using standard methods. X-ray nanodiffraction offers the unique possibility to evaluate the strain or lattice spacing at nanoscale resolution. Furthermore, the combination of nanodiffraction with additional techniques in the framework of multimodal scanning X-ray microscopy enables the direct correlation of the strain with material and device parameters such as the elemental distribution or local performance. This approach is applied for the investigation of the strain distribution in CdTe grains in fully operational photovoltaic solar cells. It is found that the lattice spacing in the (111) direction remains fairly constant in the grain cores but systematically decreases at the GBs. The lower strain at GBs is accompanied by an increase of the total tilt. These observations are both compatible with the inhomogeneous incorporation of smaller atoms into the lattice, and local stress induced by neighboring grains.
关键词： X-ray microscopy,nanodiffraction,X-ray diffraction (XRD),solar cells,multimodal,CdTe,X-ray,strain,X-ray fluorescence (XRF),photovoltaic,X-ray beam induced current (XBIC)
更新于2025-09-19 17:13:59
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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
摘要： X-ray beam induced current (XBIC) measurements allow mapping of the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is employed simultaneously with other techniques within a multi-modal X-ray microscopy approach. An example is given herein combining XBIC with X-ray fluorescence to enable point-by-point correlations of the electrical performance with chemical composition. For the highest signal-to-noise ratio in XBIC measurements, lock-in amplification plays a crucial role. By this approach, the X-ray beam is modulated by an optical chopper upstream of the sample. The modulated X-ray beam induced electrical signal is amplified and demodulated to the chopper frequency using a lock-in amplifier. By optimizing low-pass filter settings, modulation frequency, and amplification amplitudes, noise can efficiently be suppressed for the extraction of a clear XBIC signal. A similar setup can be used to measure the X-ray beam induced voltage (XBIV). Beyond standard XBIC/XBIV measurements, XBIC can be measured with bias light or bias voltage applied such that outdoor working conditions of solar cells can be reproduced during in-situ and operando measurements. Ultimately, the multi-modal and multi-dimensional evaluation of electronic devices at the nanoscale enables new insights into the complex dependencies between composition, structure, and performance, which is an important step towards solving the materials' paradigm.
关键词： XBIV,solar cell,lock-in amplification,synchrotron radiation,photovoltaics,multi-modal,XBIC,CIGS,X-ray beam induced voltage,X-ray microscopy,X-ray beam induced current
更新于2025-09-16 10:30:52
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Defect activation and annihilation in CIGS solar cells: an operando X-ray microscopy study
摘要： The efficiency of thin-film solar cells with a Cu(In1?xGax)Se2 absorber is limited by nanoscopic inhomogeneities and defects. Traditional characterization methods are challenged by the multi-scale evaluation of the performance at defects that are buried in the device structures. Multi-modal X-ray microscopy offers a unique tool-set to probe the performance in fully assembled solar cells, and to correlate the performance with composition down to the micro- and nanoscale. We applied this approach to the mapping of temperature-dependent recombination for Cu(In1?xGax)Se2 solar cells with different absorber grain sizes, evaluating the same areas from room temperature to 100 ?C. It was found that poor performing areas in the large-grain sample are correlated with a Cu-deficient phase, whereas defects in the small-grain sample are not correlated with the distribution of Cu. In both samples, classes of recombination sites were identified, where defects were activated or annihilated by temperature. More generally, the methodology of combined operando and in-situ X-ray microscopy was established at the physical limit of spatial resolution given by the device itself. As proof-of-principle, the measurement of nanoscopic current generation in a solar cell is demonstrated with applied bias voltage and bias light.
关键词： X-ray beam induced current (XBIC),solar cell,Multi-modal X-ray microscopy,X-ray fluorescence (XRF),Cu(In1?xGax)Se2 (CIGS),X-ray beam induced voltage (XBIV)
更新于2025-09-12 10:27:22