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Comparison of the Optical and Electrical Properties of Al-Doped ZnO Films Using a Lorentz Model
摘要： In this research, zinc oxide (ZnO) films are doped with various amounts of Al dopants, from 0 to 13 at.%, using ion-beam co-sputtering for Zn and Al metallic targets at room temperature. The Al-doped ZnO (AZO) films appear to have lower transmittances in the UV and near-IR ranges. The electrical and optical properties of each film are successfully analyzed by using the spectroscopic ellipsometry of two Lorentz oscillators for the two lower transmittances. The optimal AZO film is deposited with an Al-dopant of 1.5 at.% at an oxygen partial pressure of 0.12 mTorr; it has the smallest resistivity of 7.8 × 10?4 Ω cm and high transmittance of > 80% in the visible regions. The free carrier concentration and mobility evaluated using ellipsometry are different from those measured using the Hall effect. This phenomenon was the result of the grain boundary scattering due to the small ~20-nm grain size of the AZO film used in this study.
关键词： ellipsometry,grain boundary scattering,Hall effect,Lorentz oscillators,Al-doped ZnO,ZnO
更新于2025-09-23 15:22:29
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An Ellipsometric Technique with an ATR Module and a Monochromatic Source of Radiation for Measurement of Optical Constants of Liquids in the Terahertz Range
摘要： Measuring the optical constants of liquids, especially water-containing solutions, is very difficult in the terahertz range. The well-known methods of measurement of the refractive index and absorption coefficient in this range include time-domain spectroscopy and Fourier-transform spectrometry. We have developed a highly sensitive ellipsometry method for measuring the optical constants of liquids using the tunable monochromatic radiation from the Novosibirsk free-electron laser. The ellipsometer is supplemented with an internal reflection module for the measurement of highly absorbing samples. The angle of incidence on the sample in the silicon prism of the module has been optimized for maximum sensitivity to parameters to measure. Measurements of the optical constants of various liquids have been performed, and a sensitivity of 0.01 has been demonstrated.
关键词： Internal reflection ellipsometry,Free electron laser,Aqueous solution,Terahertz range
更新于2025-09-23 15:21:21
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Synthesis, ellipsometry and non-linear optical features of substituted 1,3,5-triphenylpyrazolines
摘要： Ellipsometric and nonlinear optical properties of new, differently substituted, 1,3,5-triphenylpyrazolines dyes, were studied. Results of theoretical calculation within a framework of density functional theory (DFT) technique were verified by spectroscopic ellipsometry and optical second harmonic generation (SHG) experiment at fundamental laser wavelength 1064 nm. Absorption bands and complex refractive indices were determined. Principal role of 2-thienyl substituent for first order nonlinear optical properties was demonstrated.
关键词： pyrazolines,DFT method,Nonlinear optics,spectroscopic ellipsometry
更新于2025-09-23 15:21:21
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Optical Properties and Electronic Characteristics of Cerium in the Condensed State
摘要： The results of investigating optical properties of metallic cerium in the liquid and solid film state are presented. Optical constants were measured by the ellipsometric Beattie method in the range of 0.42–2.6 μm at ambient temperature. Based on the measured refractive indices and the absorption coefficients, spectra of light conductivity σ, reflectivity R, and characteristic loss function Im ε–1 were calculated. Based on experimental measurements in the IR region, electronic characteristics of liquid cerium and its polycrystalline film and their correlation with electrical conductivity have been determined.
关键词： optical properties,cerium,rare-earth metal,characteristics of conduction electrons,ellipsometry
更新于2025-09-23 15:21:21
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Numerical analysis of earth-abundant Cu2ZnSn(SxSe1-x)4 solar cells based on Spectroscopic Ellipsometry results by using SCAPS-1D
摘要： Mixed chalcogenide CZTSSe with earth abundant elements, inexpensive, environmental-friendly and impressive photovoltaic performance is a promising absorber material for kesterite thin film solar cells of third generation. In this work, a numerical simulation of p-CZTSSe/n-CdS heterojunction solar cells have been presented using one dimensional Solar Capacitance Simulator. The influence of composition, absorber thickness, defect density and working temperature on Voc, Jsc, FF and power conversion efficiency has been investigated. The optimized cell shows 23.16% efficiency with a Voc ~ 0.724 V corresponding to 40% of the ratio.
关键词： Composition and Spectroscopic Ellipsometry,Absorption coefficient,CZTSSe,Thin film solar cell,Third generation,SCAPS,Efficiency
更新于2025-09-23 15:21:01
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Ellipsometry - Principles and Techniques for Materials Characterization || Spectroscopic Ellipsometry - Application on the Classification of Diamond-Like Carbon Films
摘要： Diamond-like carbon (DLC) films have been spreading from their theoretical basis to worldwide industrial applications because of their unique properties. Since their properties depend strongly on the conditions of synthesis, the effective classification of DLC films becomes quite necessary. From the ternary phase diagram to the Japan New Diamond Forum standard, the classification attempts are also accompanied by the continuous development of their applications. Generally, the hydrogen content and sp3/(sp2 + sp3) ratio are the primary parameters for their classification. However, researchers are afraid that currently sp3/(sp2 + sp3) ratio estimated included not only network sp3 but also sp3 hybrid carbons in the hydrogen-terminated cluster. Simultaneously, the above classification methods need to use the large equipment, such as the synchronous radiation source. Therefore, to realize more straightforward to classify DLC films efficiently, the optical constants (refractive index (n) and extinction coefficient (k)) have been proposed in 2013 to be effective method to classify the DLC films, for which a lot of considerable discussion in the past ISO/TC-107 meetings has been made. The purpose of this chapter is to introduce the latest developments of optical constants on the classification of DLC films and explore their relationship with the current standard.
关键词： spectroscopic ellipsometry,diamond-like carbon film,classification
更新于2025-09-23 15:21:01
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Optical properties of HfO <sub/>x</sub> ( <i>x</i> < 2) films grown by ion beam sputtering-deposition method
摘要： The optical properties of the HfOx films of different chemical composition (x < 2) deposited by ion beam sputtering-deposition (IBSD) method were studied. Spectral dependencies of refractive index n(λ) and extinction coefficient k(λ) were determined with ellipsometry in λ = 250–1100 nm wavelength region. The x values (i.e. [O]/[Hf] ratio) for the films were derived from x-ray photoelectron spectroscopy (XPS) data. The spectral dependences of optical constants n(λ) and k(λ) were found to undergo radical changes with x = 1.78–1.82. The films with x < 1.78 demonstrated high extinction coefficient k > 1 with the metallic-like behavior of optical constants spectral dependences. The films with x > 1.82 were found to be transparent, with k = 0 and n(λ) being well approximated by a Cauchy polynomial dependence for dielectrics. Using a sample with a gradient of x, it was established that the transition from the metallic to the dielectric-like behavior of the optical constants occurs not smoothly, but is discontinuous. A sharp jump in the optical constants is observed at x ≈ 1.8. According to XPS data, the transparent films were found to consist of two components only: HfO2 and Hf4O7 suboxide. Cauchy polynomial coefficients for Hf4O7 suboxide and HfO2 were found by using the Bruggeman effective medium approximation.
关键词： IBSD,ReRAM,spectroscopic ellipsometry,HfOx
更新于2025-09-23 15:21:01
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Nanoconfined water vapour as a probe to evaluate plasmonic heating
摘要： Engineering the photothermal effect in plasmonic materials is of paramount importance for many applications such as cancer therapy, chemical synthesis, cold catalysis and more recently for metasurfaces. Evaluation of plasmonic heating at the nanoscale is challenging and generally requires sophisticated equipments and/or temperature-sensitive probes such as fluorescent molecules or materials. Here we propose to use water vapor as probe to evaluate the local heating around plasmonic nanoparticles. We demonstrated the concept for the case of a plasmonic colloidal film composed by a bi-modal nanoporosity. In particular we exploit the thermal and light water liquid-vapor phase transitions taking place into the nanoporous medium that can be triggered by external stimulus such as heating or irradiation to obtain structural and optical variations in the films. Estimation of the local temperature was then obtained by using spectroscopic ellipsometry acquired by a multimodal chamber. More generally, this method offer a simple and general approach to determine local temperature that only requires a nanoporous material and water vapor, such as environmental humidity. In addition this approach can be further generalized to other materials, vapor molecules or optical technique.
关键词： local temperature measurement,spectroscopic ellipsometry,water vapor,nanoporous materials,plasmonic heating
更新于2025-09-23 15:19:57
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Observation of Optical Properties of Gold Thin Films Using Spectroscopic Ellipsometry
摘要： In this research work, an attempt has been made to synthesize nano-structured gold thin films over Silicon dioxide (SiO2) coated on Silicon(Si) Substrate using three deposition techniques namely DC Sputtering, Pulsed DC Sputtering, and Pulsed Laser Deposition(PLD). Optical measurements using spectroscopic ellipsometry showed that the dielectric constants of the films differed between films synthesized by different synthesis routes. This was expected because different synthesis routes yielded different microstructure. The difference in microstructures results in differences in electronic structure and therefore resulting in the differences on the optical response.
关键词： Spectroscopic ellipsometry,GIXRD,Gold thin films,Pseudo dielectric functions
更新于2025-09-23 15:19:57
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Spectroscopic ellipsometry and morphological characterizations of nanocrystalline Hg1-xMnxO oxide diluted magnetic semiconductor thin films
摘要： The structural, optical spectroscopic ellipsometry and morphological properties of nanocrystalline Hg1-xMnxO (0 ≤ x ≤ 0.2) oxide diluted magnetic semiconductor thin films synthesized by electron beam deposition technique have been investigated by means of X-ray diffraction (XRD), spectroscopic ellipsometry (SE) and atomic force microscopy (AFM) techniques. All the deposited films crystallize in the form of a hexagonal crystal structure. The integration between X-ray and atomic force microscopy data shows a very good agreement for the nanosize nature of the deposited films. For the surface roughness, good matching between the results of SE and AFM measurements was observed. In the spectral range 200–1200 nm, the real part (ε1) and imaginary part (ε2) of the dielectric constant of nanocrystalline Hg1-xMnxO films have been extracted from SE measurements. At fixed energy value, the ε1, consequently the refractive index is found to decrease with increasing Mn2+ dopant. In contrary, the energy gap (Eg) of the deposited films determined from the ε2 is found to increase as the Mn2+ concentration increases. The variation of both the ε1 and Eg as a function of Mn2+ concentration is understood based on Lorentz-Lorenz relation and sp-d exchange interaction, respectively. The results reported here show that Mn-doped HgO nanocrystalline films could be employed in the fabrication of nanoscale optical and magneto-optical devices.
关键词： Atomic force microscope,Vapor deposition,Spectroscopic ellipsometry,Optical properties,Semiconductors,AFM,Optical materials,Nanostructured materials,Thin films,X-ray diffraction
更新于2025-09-19 17:15:36