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[IEEE 2018 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC) - Kota Kinabalu (2018.10.7-2018.10.10)] 2018 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC) - Optimal Operation of Photovoltaic-Pump Hydro Storage Hybrid System
摘要： The water resource is considerably abundant and is the penetration of photovoltaic (PV) power generation gradually increasing in some areas. Due to the fluctuation of PV-alone power generation, a hybrid system with energy storage is a promising solution to improve the reliability. In this paper, an optimal operation strategy based on particle swarm optimization (PSO) of the pumped hydro storage (PHS) in the PV-PHS hybrid system is proposed, which aims to achieve minimum all-day load loss in order to increase the reliability of the PV-PHS hybrid system. Two scenarios, a winter weekday and a summer weekday, are chosen to study the proposed optimal operation strategy based on PSO. The results demonstrate that the proposed optimal operation strategy is a feasible method to achieve minimum all-day load loss.
关键词： Pumped hydro storage,Reliability,Particle swarm optimization,Hybrid system
更新于2025-09-11 14:15:04
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[IEEE 2018 7th International Conference on Renewable Energy Research and Applications (ICRERA) - Paris (2018.10.14-2018.10.17)] 2018 7th International Conference on Renewable Energy Research and Applications (ICRERA) - Reliability Comparison of a DC-DC Converter Placed in Building-Integrated Photovoltaic Module Frames
摘要： Building-Integrated Photovoltaics (BIPV) replace traditional building elements with power generating elements through the use of solar cells. One of the targets for this technology is to place the module-level power converter into the photovoltaic module’s frame to achieve an integrated system. Temperature is the most influential parameter for a converter’s reliability, its damage caused on the components needs to be studied in detail. In this paper, a reliability comparison based on a four-day mission profile has been made in order to assess the most reliable frame position for this converter to be placed in as all of them possess a different temperature profile. The results show that placing the converter in the lateral bottom of the frame is significantly more reliable than the mid or top position. In addition, a lifetime analysis is performed on the converter’s dc-link capacitor in order to demonstrate the required methodology. In future work, this can be extended towards other sensitive components when appropriate lifetime models become available. These lifetime estimations can then be combined to achieve an overall BIPV system lifetime assessment.
关键词： converter placement,BIPV,reliability,mission profile,integrated DC/DC converter
更新于2025-09-11 14:15:04
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[IEEE 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Waikoloa Village, HI (2018.6.10-2018.6.15)] 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Effect of Composition and Microstructure on the Mechanical Stability of Perovskite Solar Cells
摘要： We report on recent studies characterizing the intrinsic mechanical integrity of perovskite compositions and fully explore the role of various cation combinations, additives, and microstructure on perovskite cohesion. Adding cations to the perovskite decreased mechanical integrity, largely due to smaller grain sizes and increased concentration of PbI2. Microindentation hardness testing was performed to estimate the fracture toughness of single-crystal perovskite, and the results indicated perovskites are inherently fragile, even in the absence of grain boundaries and defects. Introducing plastically deformable cations led to a modest improvement in cohesion, and the most robust architecture was observed by infusing perovskite into a porous TiO2/ZrO2/C layer that provided extrinsic reinforcement to mechanical and environmental stressors.
关键词： fracture,perovskite solar cell,mechanical stability,reliability,module
更新于2025-09-11 14:15:04
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AIP Conference Proceedings [AIP Publishing 15th International Conference on Concentrator Photovoltaic Systems (CPV-15) - Fes, Morocco (25–27 March 2019)] 15th International Conference on Concentrator Photovoltaic Systems (CPV-15) - Woven multi-ribbon interconnection for back-contact cells: Extending the functionality of the encapsulant
摘要： Back-contact solar cells have shown their potential in the past, with record efficiencies approaching the theoretical maximum value. In parallel, industry-relevant fabrication methods of efficient cells are being developed. Next to this increased power yield, the absence of frontside metallization on the cells greatly improves their aesthetics. The main challenge to manufacture modules using back-contact cells is finding a cost-effective method to electrically interconnect them. In this work, we introduce a novel way of doing so. The interconnection concept is based on a fabric with interwoven metal interconnection ribbons and polymer encapsulant ribbons. It has the advantage of optimized material consumption, low manufacturing cost and low manufacturing temperatures, which lowers the induced thermo-mechanical stress. First proof-of-concept single cell modules have been fabricated and have shown to pass 200 thermal cycles (-40 oC to 85 oC) with no decrease in performance. These reliability tests prove the potential of the concept.
关键词： back-contact solar cells,woven fabric,encapsulant,interconnection,reliability testing
更新于2025-09-11 14:15:04
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Feasibility of Photovoltaic Solar System for Rural Electrification
摘要： Growth of our nation will totally depend upon rural development. Rural development is the main concern of growth of farmers. Farmers total growth depends upon their basic root cause of traditional farming to mould into advanced farming. Rural development of farmers through awareness of advantages of economical, clean, environment friendly, pollution free, of available renewable energy sources PV based rural electrification system for advanced farming. Rural electrification is an integral component of poverty alleviation and nation growth. Government of India has a target of solar rural electrification for irrigation through solar pumps, solar tractors, solar advanced farming equipments. Here, this research is helpful for finding out difficulties in rural electrification, awareness of policies, fundings, loan facilities, subsidies and training for the farmers. Also this research indentifies what Steps are to be initiated with Rural Electric corporation, power sector reforms and State Electricity boards. Also this research provides the features of rural electrification in India and the photovoltaic solar farming, solar home systems for rural electrification.
关键词： Reliability,Cost effective,Multi objective optimization,Quality of service,PV,Solar pumps,Wind,Irrigation system,Rural development,Rural Electrification,Renewable energy system
更新于2025-09-11 14:15:04
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Feasibility of Macular Integrity Assessment (MAIA) Microperimetry in Children: Sensitivity, Reliability, and Fixation Stability in Healthy Observers
摘要： PURPOSE. To assess the feasibility of macular integrity assessment (MAIA) microperimetry (MP) in children. Also to establish representative outcome measures (differential light sensitivity, ?xation stability, test–retest reliability) for children without visual impairment. METHODS. Thirty-three adults and 33 children (9–12 years) were asked to perform three monocular MAIA examinations within a single session (dominant eye only). RESULTS. Children exhibited poorer test–retest reliability than adults for measures of both mean sensitivity (95% coef?cient of repeatability [CoR95] ? 2.7 vs. 2.3 dB, P ? 0.036) and pointwise sensitivity (CoR95 ? 6.2 vs. 5.7 dB, P < 0.001). Mean sensitivity was lower in children (27.6 vs. 29.5 dB, P < 0.001), and ?xation stability was poorer (95% bivariate contour ellipse area [BCEA95] ? 4.58 vs. 1.14, P < 0.001). Mean sensitivity was negatively correlated with ?xation stability (r ? (cid:2)0.44, P < 0.001). Both children and adults exhibited substantial practice effects, with mean sensitivity improving by 0.5 dB (adults) and 0.9 dB (children) between examinations 1 and 2 (P (cid:3) 0.017). There were no signi?cant differences between examinations 2 and 3 (P ? 0.374). CONCLUSIONS. Microperimetry is feasible in 9- to 12-year-old children. However, systematically lower sensitivities mean that the classi?cation boundary for "healthy" performance should be lowered in children, pending development of techniques to improve attentiveness/?xation that may reduce or remove this difference. High measurement variability suggests that the results of multiple tests should be averaged when possible. Learning effects are a potential confound, and it is recommended that the results of the ?rst examination be discarded.
关键词： test-retest reliability,MAIA,microperimetry,visual ?elds,differential light sensitivity,perimetry,children
更新于2025-09-11 14:15:04
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[ASME ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - San Francisco, California, USA (Monday 27 August 2018)] ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - Controlling the Solder Joint Reliability of eWLB Packages in Automotive Radar Applications Using a Design for Reliability Approach
摘要： A DfR (Design for Reliability) approach which is systematically based on simulation, sensitivity analysis and experimental validation is applied for identifying, understanding and controlling the key factors which determine the solder joint reliability of eWLB (Embedded Wafer Level Ball Grid Array) packages that carry embedded 77 GHz dies and sit on hybrid PCB (Printed Circuit Board) stacks. The hybrid stack investigated in this work is characteristic to automotive RADAR (Radio Detection And Ranging) applications and consists of one low-loss RF (Radio Frequency) layer and several FR4 layers. In line with previous work [1], the mechanical material properties of the low-loss RF laminate material are found to be the key factor. Simulation is used to systematically screen for mechanical properties which are favorable for achieving a high solder joint reliability on the unconstrained PCBs used for standardized solder joint reliability testing. A simplified virtual assessment of PCBs constrained by the mounting in system module housings is done. Both simulation and experimental results show that RF laminate materials with low Young’s modulus are the class of materials which allows for the highest solder joint reliability for all the conditions investigated in this study.
关键词： RF laminate,Design for Reliability,eWLB,solder joint reliability,automotive RADAR
更新于2025-09-10 09:29:36
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Buffer Vertical Leakage Mechanism and Reliability of 200-mm GaN-on-SOI
摘要： A comprehensive study on buffer vertical leakage mechanism and buffer reliability of 200-mm GaN-on-SOI is conducted in this paper. The buffer vertical leakage current versus bias is found to sequentially comprise three ranges of low-field leakage, variable-range hopping, and breakdown. The low-field leakage increase at high temperatures has been proven to be dominated by surface leakage. The stressing voltages of buffer time-dependent breakdown (TDB) measurements have a significant impact on shape factor β. Stress-induced leakage current is observed in the wear-out phase of the TDB curves. Stress-and-sense measurements in this phase indicate that defects are generated probably around the threading dislocations, where more localized Joule heating and more defects are created by a positive feedback, and finally, the buffer breaks down due to thermal runway. At last, based on the Weibull plot and E-model, the operating voltage is extrapolated to be 470 V corresponding to an expected lifetime of 10 years at 175 °C, with area scaling to the drain terminal of a 150-mm power transistor and failures scaling to 0.01%. The qualification of GaN-on-SOI is crucial for future 200-V GaN power integrated circuit on this platform.
关键词： GaN-on-SOI,time-dependent breakdown (TDB),leakage mechanism,Buffer reliability
更新于2025-09-10 09:29:36
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Effects of Copper Migration on the Reliability of Through-Silicon Via (TSV)
摘要： Non-destructive electrical characterization was performed to detect copper migration in a degraded through-silicon via structure after various stressing conditions such as elevated temperature exposure, temperature cycling and electrical biasing. They were performed either independently or as a combination with electrical bias for comparison. Variations in the electrical characteristics reflect the presence of copper. The electrical characteristics were also able to monitor the transport of copper ions from an applied electric field. Physical failure analysis was performed to verify the presence of migrated copper, correlating to the changes observed during electrical measurement. With this understanding, reliability assessments become possible where this paper seeks to value add to verify the influence of Cu migration on the conduction mechanism and TDDB lifetime, understanding.
关键词： Electrical characterization,Through-silicon vias,Reliability testing,Dielectric breakdown,Copper
更新于2025-09-10 09:29:36
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Comparison of Reliability in Diabetic Macular Edema Estimates between Two Image Analysis Algorithms
摘要： Purpose: To evaluate segmentation reliability in diabetic macular edema (DME) estimates between a CirrusTM HD-OCT image analysis algorithm and an Iowa reference algorithm, which are an automatic segmentation software. Methods: Thirty eyes from 23 patients diagnosed with DME were included and underwent spectral-domain optical coherence scans (CirrusTM HD-OCT). Central foveal thickness (CFT) and ganglion cell layer-inner plexiform layer segmentation data were compared with those produced by the CirrusTM HD-OCT segmentation algorithm and Iowa reference algorithm. Measurement agreement was assessed using intraclass correlation (ICC) and segmentation errors were confirmed by 2 ophthalmologists. Results: The mean CFT in the 1-mm central area determined by the manufacturer-supplied Cirrus software and Iowa reference algorithm was 512.07 ± 182.35 μm and 476.53 ± 32.36 μm, respectively (p < 0.05). The mean paired difference was 35.53 ± 92.46 μm (ICC, 0.929). Segmentation errors were demonstrated in eyes with a CFT less than 400 μm, specifically for 45% of scans obtained by the Cirrus algorithm and 9% from the Iowa algorithm; in eyes with a CFT equal to or higher than 400 μm, the error rates were 95% and 42%, respectively. Conclusions: CFT measurement in eyes with diabetic macular edema using the Cirrus algorithm and Iowa algorithm showed relatively high degrees of agreement and significant correlation. In eyes with a CFT equal to or higher than 400 μm, the Iowa algorithm showed higher reliability in retinal segmentation than the Cirrus algorithm.
关键词： Reliability,Segmentation algorithm,Diabetic macular edema,Optical coherence tomography,Central foveal thickness
更新于2025-09-10 09:29:36