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- 摘要
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Photovoltaic Module Reliability || Introduction
摘要： Photovoltaics (PVs) is the direct conversion of light into electricity. Typically, this means generation of electricity from sunlight, a renewable energy process without release of pollution or greenhouse gases. PV is one of the renewable energy sources that offers the potential to replace burning of fossil fuels and, therefore, to slow the growing effects of global climate change.
关键词： Module reliability,Renewable energy,Photovoltaics,PV modules,Solar cells
更新于2025-09-19 17:13:59
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Photovoltaic Module Reliability || What does the Future Hold for PV and a Brief Summary
摘要： The discussions in the previous chapters looked at both the history and present‐day status of photovoltaics (PV) module reliability and the accelerated stress testing associated with it. In this final chapter, the focus will shift to the future. PV is a dynamic industry so the technology and the testing standards are constantly evolving. The first section in this chapter will provide an update on the changes already in progress for some of the more important module qualification and safety standards. The second section will switch to a longer‐range view, discussing how PV module reliability is likely to change in the future and what sort of accelerated stress testing will be necessary to validate the quality of the huge volume of modules produced. The book will end with a brief summary of the status of PV module reliability today.
关键词： accelerated stress testing,flexible modules,IEC 61215,IEC 61730,bifacial modules,module lifetime,degradation rates,PV module reliability,photovoltaics
更新于2025-09-19 17:13:59
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Photovoltaic Module Reliability || Module Failure Modes
摘要： Initial product reliability assessments are based on the environment in which the product is going to be exposed, the outdoor terrestrial environment in the case of photovoltaic (PV) modules. Such an analysis can provide some clues as to the level of stresses to be encountered. The earliest module manufacturers understood that the modules would be required to endure exposure to the weather (rain, hail, and snow), high temperatures, UV, humidity, and thermal cycling. However, in most cases, the stresses were underestimated. The first generation of terrestrial PV modules was not very reliable nor did the modules survive for very long in the field. However, this first generation of product served an important function in that they failed in the field (often very quickly) allowing for subsequent analysis and development of accelerated stress tests to be described in Chapter 3. It wasn’t until the product designs could be tested using the accelerated stress tests that reliability was significantly improved.
关键词： failure modes,field failures,photovoltaic modules,reliability,accelerated stress tests
更新于2025-09-19 17:13:59
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Photovoltaic Module Reliability || Development of Accelerated Stress Tests
摘要： The chapter discusses the development of accelerated stress tests (ASTs) for photovoltaic (PV) modules to identify and mitigate field failure modes. It outlines various ASTs such as Thermal Cycling, Damp Heat, Humidity Freeze, UV Light Exposure, Static Mechanical Load, Cyclic (Dynamic) Mechanical Load, Reverse Bias Hot Spot Test, Bypass Diode Thermal Test, and Hail Test, detailing their parameters and the failure modes they address. The importance of ASTs in improving module reliability and lifetime is emphasized, along with the challenges in accelerating certain processes without altering the failure mechanisms.
关键词： Reverse Bias Hot Spot Test,UV Light Exposure,Damp Heat,Static Mechanical Load,Hail Test,Thermal Cycling,Photovoltaic Module Reliability,Accelerated Stress Tests,Humidity Freeze,Bypass Diode Thermal Test,Cyclic (Dynamic) Mechanical Load
更新于2025-09-19 17:13:59
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Photovoltaic Module Reliability || Qualification Testing
摘要： Chapter 3 described the types of accelerated stress tests that are typically applied to photovoltaic (PV) modules. These tests are used in research to evaluate how well modules perform in relation to the specific stresses applied during these tests. However, what the industry needs is a defined set of accelerated stress tests that can be applied to all modules in the same way. Such a set of tests are called Qualification Tests or often in Europe are referred to as Type Approval Testing. Qualification tests are a set of well‐defined accelerated stress tests developed out of a reliability program. They incorporate strict pass/fail criteria. Hoffman and Ross [1] defined the purpose of qualification testing as a means of rapidly detecting the presence of known failure or degradation modes in the intended environment(s). The stress levels and durations are limited so the tests can be completed within a reasonable amount of time and cost. One of the goals of Qualification testing is for a significant number of commercial module types to pass and that all subsequent production modules will be built the same way as the modules that were tested. Passing the Qualification test says the product meets the specific set of criteria, but doesn’t predict product lifetime nor indicate which product will last longer or which will degrade in operation. However, if properly designed, the Qualification test will be a good indicator that modules passing the test sequence will not suffer from infant mortality – that is they will survive for a reasonable amount of time in the field. The real usefulness of such a Qualification test sequence can only be validated by assessing the field performance of products that have successfully passed the test sequence.
关键词： failure or degradation modes,reliability program,pass/fail criteria,photovoltaic (PV) modules,Type Approval Testing,field performance,Qualification Tests,infant mortality
更新于2025-09-19 17:13:59
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Reliability analysis and design of a single diode solar cell model using polynomial chaos and active subspace
摘要： In recent times, photovoltaic power systems are being used worldwide with a high rate of adoption as a source of clean energy. It is therefore important to study the impact of environmental uncertainties on the yielding power of these solar cells. This paper considers the problem of reliability analysis/design for the yield power in a single diode solar cell when there are uncertainties in the outdoor conditions (e.g. temperature, irradiance) with polynomial chaos and active subspace methods. With the polynomial chaos based surrogate modeling of the yield power, one can accurately and efficiently compute the mean and variance of the yielding power. Following this, reliability design is formulated as a bi-objective optimization problem involving (A) maximization of the mean power yield and (B) minimization of the power yield variation under temperature and irradiance uncertainties. The active subspace method is used to simplify the bi-objective formulation. It is found that utilizing the active subspace method can simplify the bi-objective nonlinear design problem to a bi-objective linear optimization one. Our simulation result shows that the bi-objective linear optimization problem results in a higher mean and lower variance in the maximum power point (MPP) than the direct non-linear design approach.
关键词： Polynomial chaos,Single diode solar cell,Active subspace,Reliability,Multi-objective optimization
更新于2025-09-19 17:13:59
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[IEEE IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - Lisbon, Portugal (2019.10.14-2019.10.17)] IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - Techno-Economic Analysis of Building Integrated Photovoltaics Electrical Installations
摘要： Insulated-gate bipolar transistor (IGBT) power modules find widespread use in numerous power conversion applications where their reliability is of significant concern. Standard IGBT modules are fabricated for general-purpose applications while little has been designed for bespoke applications. However, conventional design of IGBTs can be improved by the multiobjective optimization technique. This paper proposes a novel design method to consider die-attachment solder failures induced by short power cycling and baseplate solder fatigue induced by the thermal cycling which are among major failure mechanisms of IGBTs. Thermal resistance is calculated analytically and the plastic work design is obtained with a high-fidelity finite-element model, which has been validated experimentally. The objective of minimizing the plastic work and constrain functions is formulated by the surrogate model. The nondominated sorting genetic algorithm-II is used to search for the Pareto-optimal solutions and the best design. The result of this combination generates an effective approach to optimize the physical structure of power electronic modules, taking account of historical environmental and operational conditions in the field.
关键词： power cycling (PC),Aging,fatigue,insulated-gate bipolar transistors (IGBTs),thermal cycling (TC),multiobjective,optimization methods,reliability,finite-element (FE) methods
更新于2025-09-19 17:13:59
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[IEEE 2019 IEEE International Symposium on Measurement and Control in Robotics (ISMCR) - Houston, TX, USA (2019.9.19-2019.9.21)] 2019 IEEE International Symposium on Measurement and Control in Robotics (ISMCR) - Eliminating residual sway of crane loads based on laser slot sensor information
摘要： Despite the significant attention transmission switching (TS) has gained over the last decade, important challenges remain. This paper addresses the state-of-the-art challenges of TS by studying the benefits of corrective switching using authentic Independent System Operator of New England (ISO-NE) data and software. Thus, the results and analyses presented in this paper are more convincing than any other study conducted to date. TS is successfully implemented for reliability applications as a corrective mechanism. ISO-NE maintains N?1 reliability based on the preventive dispatch and enforcing proxy reserve requirements along with N?1?1 reliability based on reserves and interface limits. This paper incorporates TS as a corrective mechanism in response to both the N?1 and N?1?1 events. Not only does this paper investigate the capability of corrective switching to alleviate thermal overloads but also the economic benefits of corrective switching with actual market data and in-house market software at ISO-NE. The results show that corrective TS can improve the reliability of the system and save millions of dollars each year by providing a cheaper corrective action alternative for ISO-NE. The results also suggest that TS would provide more significant benefits for systems with more transmission congestion such as Pennsylvania New Jersey Maryland, Midcontinent Independent System Operator, and Electric Reliability Council of Texas.
关键词： power system economics,transmission switching,power system reliability,Interface limits,power transmission control
更新于2025-09-19 17:13:59
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Highly Elastic and >200% Reversibly Stretchable Downa??Conversion White Lighta??Emitting Diodes Based on Quantum Dot Gel Emitters
摘要： Combining the characteristics of different materials offers exciting new opportunities for advanced applications in various fields. Herein, white light-emitting diodes (WLEDs) with >200% reversible stretchability are fabricated using six-color quantum dots (QDs) gel emitters. Stable aqueous-phase alloy core/shell QDs with high quantum yield are obtained via ligand exchange using a ternary solvent system. Transparent and highly stretchable gels with large pores are created by binary-solvent-based gelation at low temperatures. Importantly, the QDs and the gel originate from the same two solvents, which make the QDs highly compatible with the gelation process. Consequently, QDs of six different colors are incorporated into the gel without any property degradation. The excellent optical properties of the QDs in the liquid phase (e.g., 17% higher photoluminescence (PL) intensity) are retained in the gel phase. The QD gel (QDG) exhibits elastic deformation up to 200%, with uniform PL over the entire gel. A down-conversion WLED built using the QDG emitter produces cool white light with a color temperature of 6100 K, a color rendering index of 94, and a luminous efficacy of 72 lm W?1. In addition, the performance of the QDG-based WLED remains unchanged even after more than 1000 bending/stretching cycles.
关键词： white light emitting diodes,gels,mechanical reliability,form factors,quantum dots
更新于2025-09-19 17:13:59
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Using Large Datasets of Organic Photovoltaic Performance Data to Elucidate Trends in Reliability Between 2009 and 2019
摘要： The application of data analytical approaches to understand long-term stability trends of organic photovoltaics (OPVs) is presented. Nearly 1900 OPV data points have been catalogued, and multivariate analysis has been applied in order to identify patterns, produce models that quantitatively compare different internal and external stress factors, and subsequently enable predictions of OPV stability to be achieved. Analysis of the weights associated with the acquired predictive model shows that for light stability (ISOS-L) testing, the most significant factor for increasing the time taken to reach 80% of the initial performance (T80) is the substrate and top electrode selection, and the best light stability is achieved with a small molecule active layer. The weights for damp-heat (ISOS-D) testing shows that the type of encapsulation is the primary factor affecting the degradation to T80. The use of data analytics and potentially machine learning can provide researchers in this area new insights into degradation patterns and emerging trends.
关键词： Organic solar cells,reliability,photovoltaics
更新于2025-09-19 17:13:59