研究目的
To investigate and compare the sol-gel and nanoparticles (NPs)-based nickel oxide hole-transporting layer (HTL) for high-performance planar perovskite solar cells (PSCs).
研究成果
The sol-gel-based device showed a relatively higher PCE of 17.365% than that of the NPs-based device (16.110%). Despite the NPs having more favorable WF and conductivity, the sol-gel films exhibited better film morphology with lower surface roughness and better interfacial contact with the perovskite layer, leading to more efficient charge transport, extraction, and suppressed charge recombination, resulting in better device-performance.
研究不足
The study acknowledges that although NPs exhibit favorable interfacial properties, their use as HTL may lead to degradation of charge transport and extraction due to insufficiently covered surfaces with higher RMS roughness compared to sol-gel films.
The study involved the preparation of NiOx sol-gel and NPs films, their characterization using various spectroscopic and microscopic techniques, and the fabrication of PSCs to evaluate their performance. The experimental design included optimizing film thicknesses and annealing temperatures for both types of NiOx HTLs, followed by a detailed analysis of their effects on device performance.
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UV-vis/NIR spectrophotometer
LAMBDA 750
PerkinElmer
Measurement of absorption and transmission spectra
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Spectrophotometer
RF-6000
SHIMADZU
Measurement of steady-state photoluminescence (PL)
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nickel (II) acetate tetrahydrate
Sigma Aldrich
Used in the preparation of NiOx sol-gel solution
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ethanol
Sigma Aldrich
Solvent for preparing NiOx sol-gel solution
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ethanolamine
Sigma Aldrich
Additive in the preparation of NiOx sol-gel solution
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NiOx nanoparticles
NICT-7, Lot No: BH6-1
1-material
Used as a hole transporting layer in perovskite solar cells
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UV-ozone cleaner
Treatment of ITO-patterned substrate
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Keithley 2400
Measurement of photocurrent density-voltage (J-V) characteristics
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Oriel solar simulator
Class AAA
Simulation of AM 1.5 G sunlight for J-V measurements
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Hitachi, S-4800
Scanning electron microscopy (SEM) analysis
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XE7, Park systems
Atomic force microscope (AFM) analysis
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Impedance analyzer
CompactStat
Ivium Technologies
Electrochemical impedance spectroscopy (EIS) measurement
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Tektronix oscilloscope
DPO-2014B
Transient photocurrent (TPC) measurement
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