研究目的
To enhance light extraction and improve angular color shift in bottom emission organic light emitting diode (OLED) devices by applying high refractive index nanoparticle material as a scattering layer on the inner side of a glass substrate.
研究成果
The implemented YSZ nanoparticle material and planarization material endured the subsequent thermal annealing process without deformation. A 38% enhancement in luminance of the OLED device was achieved by the scattering layer with a thickness of 2.5 μm, compared to the device without the scattering layer. The white angular dependency (WAD) Δu’v’ was reduced to 0.005 at 60 degrees from normal direction, indicating a significant decrease in angular color change.
研究不足
The use of TiO2 nanoparticles was limited due to poor dispersivity in PGMA solvent and a lower curing temperature than required for the subsequent LTPS TFT process. The thickness of the scattering layer affects both the scatter effect and transmittance, requiring optimization.
1：Experimental Design and Method Selection:
TiO2 and YSZ nanoparticles were examined as high refractive index materials. The nanoparticle material was formed as a scattering layer on a glass substrate by a coating method, followed by a thermal curing process. A planarization layer was then coated on the scattering layer.
2：Sample Selection and Data Sources:
Conventional bottom emission white OLED display devices were used to investigate the effect of the high refractive index nanoparticle scattering layer.
3：List of Experimental Equipment and Materials:
TiO2 and YSZ nanoparticles, propylene glycol methyl ether acetate (PGMA) solvent, SiO2 solution for planarization, Keithley 236 voltage source unit, silicon photodiode (Hamamatsu Photonics, S5227-1010BQ), photomultiplier tube, and spectroradiometer (Minolta, CS-1000).
4：0).
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The nanoparticle suspension was coated on the glass substrate, forming the scattering layer, followed by a thermal curing process. A planarization layer was then applied and cured. The conventional LTPS TFT manufacturing process was performed on the planarization layer.
5：Data Analysis Methods:
Measurements of OLED properties were performed by recording current–voltage characteristics as well as electro-luminescence (EL) spectra. The LightTools program was used for simulation of luminance change.
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