研究目的
To demonstrate nonlinear microscopy of PbI2 nanosheets for determining their crystalline orientation and thickness using SHG and THG.
研究成果
Nonlinear microscopy of PbI2 nanosheets using SHG and THG provides a novel technique for non-invasive optical characterization of their crystalline orientation and thickness, opening new possibilities for optoelectronic device applications.
研究不足
The study is limited to PbI2 nanosheets up to 100 nm thickness and does not explore other halide semiconductors or thicker samples.
1:Experimental Design and Method Selection:
Nonlinear microscopy using SHG and THG to characterize PbI2 nanosheets.
2:Sample Selection and Data Sources:
PbI2 nanosheets fabricated on silica-on-silicon substrate by saturated solution grown method.
3:List of Experimental Equipment and Materials:
Infrared femtosecond laser for excitation.
4:Experimental Procedures and Operational Workflow:
Excitation at normal incidence, observation of SHG and THG, mapping of emissions, and polarization and thickness dependence measurements.
5:Data Analysis Methods:
Analysis of SHG and THG intensity patterns and thickness dependence.
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