研究目的
Investigating the adaptation of focal intensity distributions for femtosecond laser material processing on the micro- and nanoscale.
研究成果
The study demonstrated the effectiveness of tailored focal intensity distributions in improving femtosecond laser material processing results, including the generation of homogeneous large-area LIPSS and the reduction of processing time. The beam shaping device was shown to be suitable for use with a scanner and an F-theta lens, offering potential for industrial applications.
研究不足
The study focused on stainless steel as the substrate material and may not be directly applicable to other materials without further investigation.
1:Experimental Design and Method Selection:
The study utilized a diode pumped Yb:KYW thin disk fs-laser system for material processing, with beam shaping to achieve tailored focal intensity distributions.
2:Sample Selection and Data Sources:
Commercially available austenitic stainless steel was used as the substrate material.
3:List of Experimental Equipment and Materials:
The setup included a beam expander, a beam shaping element, a galvanometer scanner equipped with an F-theta objective lens, and a beam profiling camera.
4:Experimental Procedures and Operational Workflow:
The laser beam was focused on the sample surface, and the focal intensity distributions along the z-direction were analyzed.
5:Data Analysis Methods:
The surface morphology was characterized by scanning electron microscopy and white light interference microscopy, with LIPSS properties quantified by 2D-Fourier transform analysis.
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F-theta objective lens
JENar
Jenoptik
Used for focusing the laser beam on the sample surface.
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beam profiling camera
SP928
Ophir
Used for analyzing the focal intensity distributions along the z-direction.
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scanning electron microscopy
SigmaVP
Carl Zeiss
Used for characterizing the morphology of the laser processed sample surfaces.
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white light interference microscopy
CCI HD
Taylor Hobson
Used for evaluating the surface topography.
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Yb:KYW thin disk fs-laser system
JenLas D2.fs
Jenoptik
Used as the radiation source for laser material processing.
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galvanometer scanner
IntelliScan14
Scanlab
Used for scanning the focused fs-laser beam over the sample surface.
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