研究目的
To utilize ZnAl2O4 (gahnite) spinel as antireflection coating material to improve the power conversion efficiency of silicon solar cells.
研究成果
The study concludes that gahnite (ZnAl2O4) spinel is a suitable anti-reflection coating material for silicon solar cells, significantly improving their power conversion efficiency. The optimal performance was achieved with triple layer deposition, showing a maximum of 93% transmittance and 20.72% power conversion efficiency at a low cell temperature.
研究不足
The study focuses on the application of gahnite as an anti-reflection coating on silicon solar cells, with potential limitations in scalability and cost-effectiveness of the sol–gel and spin coating techniques for large-scale production.
1:Experimental Design and Method Selection:
The study employed sol–gel technique for synthesizing gahnite and spin coating technique for depositing gahnite layers on silicon solar cells.
2:Sample Selection and Data Sources:
Precursors zinc nitrate hexahydrate and aluminum nitrate nonahydrate were used. Polycrystalline silicon solar cells were procured for coating.
3:List of Experimental Equipment and Materials:
Atomic force microscopy (AFM), X-ray diffraction (XRD), Thermogravimetric (TG) and Differential Thermal Analysis (DTA), energy dispersive X-Ray fluorescence (XRF) spectrometer, high resolution transmission electron microscopy (HR-TEM), Varian, Cary 5000 UV–Vis-NIR spectrophotometer, field emission scanning electron microscopy (FE-SEM), keithley 2450 source meter, four probe technique, infrared thermal imaging.
4:Experimental Procedures and Operational Workflow:
Gahnite was synthesized and deposited in layers on silicon solar cells. The layers' influence on the cells' properties was analyzed.
5:Data Analysis Methods:
Structural, optical, electrical properties and cell temperature were analyzed to determine the efficiency improvements.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
X-ray diffraction
X’ Pert Pro
PANalytical
Determining the structural properties and crystallinity of the samples
-
Energy dispersive X-Ray fluorescence spectrometer
EDX-720
Shimadzu
Determining the chemical composition of the sample
-
High resolution transmission electron microscopy
JEM 2100
Jeol
Characterizing surface morphology and microstructural features of the sample
-
Source meter
2450
Keithly
Determining the J–V characteristics of coated and uncoated silicon solar cells
-
Infrared thermal imaging
Ti100 Series
Fluke
Examining temperature analyses of coated and uncoated solar cells
-
Atomic Force Microscopy
Nanosurf
Switzerland
Measuring the thickness of the prepared gahnite sheets
-
Thermal analyzer
SII 6300
EXSTAR
Performing Thermogravimetric (TG) and Differential Thermal Analysis (DTA)
-
UV–Vis-NIR spectrophotometer
Cary 5000
Varian
Examining the absorption spectra of the coated samples
-
Field emission scanning electron microscopy
MIRA 3
TESCAN
Characterizing the surface morphology and coating thickness of thin films
-
Four probe technique
SK012
Osaw
Determining the resistivity of pure and coated silicon solar cells
-
登录查看剩余8件设备及参数对照表
查看全部