研究目的
Investigating the plasmonic enhancement of electromagnetic field energy density at the sharp tips of nanoparticles or nanoscale surface roughnesses of hydrogen-absorbing transition metals, Pd, Ti, and Ni.
研究成果
A large degree of energy focusing was observed for hydrogen-absorbing transition metals in the microwave region, even surpassing the enhancement for noble metals according to the conditions. The metal surfaces possibly contained such degrees of nano- or micro-scale native random roughnesses, and, therefore, the field enhancement effect may have been unknowingly produced in existing electrical and optical systems.
研究不足
The electrostatic calculation results are valid for particle sizes smaller than the fields’ wavelengths at which the phase retardation is negligible throughout the particle object. The dielectric functions of materials used for calculations are empirical values for bulk materials, whose validity is debatable when the particle sizes become smaller than 10 nm.
1：Experimental Design and Method Selection:
The study is based on numerical calculations of field enhancement factors for prolate-spheroidal metal nanoparticles in air, H2, or vacuum, and H2O, using classical electromagnetic field theory in the quasistatic limit.
2：Sample Selection and Data Sources:
The calculations specifically focus on the field enhancement factors at the tips of the prolate-spheroidal metal nanoparticles to represent sharp-curvature metal surfaces.
3：List of Experimental Equipment and Materials:
The study uses empirical complex dielectric functions of metals and surroundings for computations.
4：Experimental Procedures and Operational Workflow:
The electric field outside the spheroid and at the tip is calculated using a formalism based on the quasistatic limit, with field enhancement factors representing the intensity ratios for fields around the object to those in the absence of the object.
5：Data Analysis Methods:
The field enhancement factor is calculated as the ratio of field intensities, with the empirical complex dielectric functions of materials used for computations.
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