研究目的
To develop a catalyst-free method to produce high-quality GaSb nanowires with improved photoresponse properties for broad spectral response photodetectors.
研究成果
GaSb NWs were grown successfully in a conventional CVD system via a self-catalyzed approach. The as-synthesized GaSb NWs possessed a typical p-type semiconductor character with the hole mobility of 0.042 cm2 V?1 s?1 and wide spectral response from ultraviolet to near-infrared region. Both rigid and flexible photodetectors were fabricated on the GaSb NWs, exhibiting large responsivity, high external quantum efficiency, and ultrahigh detectivity.
研究不足
The photoresponse properties of GaSb NWs are usually not as good as other semiconductor NWs mainly due to the high dark current induced by the natural high hole mobility of GaSb NWs.
1:Experimental Design and Method Selection:
A simple self-catalyzed CVD method was utilized to synthesize GaSb NWs with Ga droplets as the impurity-free catalysts.
2:Sample Selection and Data Sources:
Commercial GaSb powders were used as the source, and (100) Si wafer coated with 8 nm Ga film was utilized as the substrate.
3:List of Experimental Equipment and Materials:
A horizontal quartz tube furnace, field-emission scanning electron microscope (SEM, Hitachi S4800), transmission electron microscope (TEM, JEOL JEM-3000F) equipped with energy dispersive spectroscopy (EDS).
4:Experimental Procedures and Operational Workflow:
The furnace was first pumped to 1×10?2 torr, and then flowed with N2/H2 gas (volume ratio 9:1) with a constant flux of 50 sccm. The temperature was increased to 800°C in 45 min and kept for 2 h.
5:Data Analysis Methods:
The photoelectric signals were collected from the source and drain electrodes at a given bias during the incident light irradiation.
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field-emission scanning electron microscope
S4800
Hitachi
Characterization of the morphology of the synthesized sample
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transmission electron microscope
JEM-3000F
JEOL
Investigation of the microstructures and composition with energy dispersive spectroscopy (EDS)
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semiconductor test system
4200-SCS
Keithley
Measurement of the device performance
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power meter
NOVA
Ophir
Testing the power density of the incident light
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xenon lamp
500W
Incident light source
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monochromator
7ISW301
Providing monochromatic light
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