研究目的
Investigating the tunable optical properties in self-assembled BaTiO3-Au hybrid thin films via Au-phase geometry control.
研究成果
The study successfully demonstrates the tunability of optical properties in BaTiO3-Au hybrid nanostructures by controlling the Au-phase geometry through film thickness variation. This approach offers a promising platform for designing novel optical components with tailored properties for integrated photonic devices.
研究不足
The study is limited by the precision of controlling the Au-phase geometry and the potential for defects in the thin films that may affect optical properties. Future work could explore a wider range of material combinations and more precise control over nanostructure geometry.
1:Experimental Design and Method Selection:
The study employs a one-step pulsed laser deposition (PLD) technique to fabricate self-assembled BaTiO3-Au vertically aligned nanocomposite thin films with varying thicknesses.
2:Sample Selection and Data Sources:
BaTiO3-Au thin films with thicknesses ranging from 70 nm to 3 nm were grown on SrTiO3 (001) substrates.
3:List of Experimental Equipment and Materials:
A KrF excimer laser (Lambda Physik Compex Pro 205, λ = 248 nm) was used for PLD. Microstructure characterization was performed using XRD, STEM-HAADF, EDS, and SAED. Optical properties were measured using UV-vis-NIR spectrophotometry and ellipsometry.
4:Experimental Procedures and Operational Workflow:
Films were deposited at 600°C in high vacuum, with thickness controlled by varying the number of laser pulses. Post-deposition, samples were cooled under vacuum.
5:Data Analysis Methods:
Optical spectra were analyzed to determine LSPR and hyperbolic dispersion properties. Ellipsometric data were fitted to derive permittivity and refractive index.
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X-ray diffractometer
Panalytical X’Pert
Panalytical
Characterization of crystallinity and microstructure of the films.
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TEM
FEI Talos F200X
FEI
Microstructure characterization including STEM-HAADF and EDS for chemical mapping.
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HRSTEM
FEI Titan
FEI
High-resolution STEM imaging.
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UV-vis-NIR spectrophotometer
Perkin Elmer Lambda 1050
Perkin Elmer
Measurement of optical transmittance (T%) and reflectance (R%) spectra.
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Spectroscopic ellipsometer
J.A. Woollam RC2
J.A. Woollam
Measurement of ellipsometric psi (Ψ) and delta (Δ) data.
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AFM
Bruker Icon
Bruker
PFM measurement.
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KrF excimer laser
Lambda Physik Compex Pro 205
Lambda Physik
Used for pulsed laser deposition (PLD) technique to fabricate thin films.
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