研究目的
Investigating the enhancement of photocatalytic nitrogen fixation efficiency through the modification of Bi2WO6 with graphene quantum dots.
研究成果
The GQD/Bi2WO6 composites exhibit significantly enhanced photocatalytic nitrogen fixation efficiency under visible light, attributed to the improved separation efficiency of photoinduced electron-hole pairs and reduced resistance. The 10GQD/Bi2WO6 composite showed the highest ammonia synthesis rate, demonstrating the potential of GQD modification in enhancing photocatalytic performance.
研究不足
The study does not address the scalability of the synthesis method for industrial applications or the long-term stability of the composites under continuous operation.
1:Experimental Design and Method Selection:
The study employed a hydrothermal method to synthesize GQD/Bi2WO6 composites.
2:Sample Selection and Data Sources:
Bi2WO6 was synthesized via hydrothermal method, and GQD were synthesized by a recorded method. Different volumes of GQD were added to Bi2WO6 to form composites.
3:List of Experimental Equipment and Materials:
Equipment included a Shimadzu XRD-6000 diffractometer, JEOL JSM-7001F SEM, JEOL-JEM-2010 TEM, ESCALab MKII XPS spectrometer, IS50 FT-IR, UV-vis spectrophotometer, and TriStar 3020 BET analyzer. Materials included Bi(NO3)2·5H2O, Na2WO4·2H2O, and GQD.
4:Experimental Procedures and Operational Workflow:
The photocatalytic N2 fixation test was performed under a 300 W Xe lamp, with the ammonia synthesis rate determined by Nessler’s reagent method. Electrochemical analyses were conducted using a CHI660B electrochemical workstation.
5:Data Analysis Methods:
The optical absorption property was tested by UV-Vis diffuse reflectance spectrums, and the specific surface area was calculated with the BET method.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Shimadzu XRD-6000 diffractometer
XRD-6000
Shimadzu
X-ray diffraction analysis
-
JEOL JSM-7001F SEM
JSM-7001F
JEOL
Scanning electron microscopy, EDS, and elemental mapping
-
JEOL-JEM-2010 TEM
JEM-2010
JEOL
Transmission electron microscopy
-
IS50 FT-IR
IS50
Thermo Nicolet
Fourier transform infrared spectroscopy
-
UV-vis spectrophotometer
UV-2600
Shimadzu
Ultraviolet visible diffuse reflectance spectrums
-
ESCALab MKII XPS spectrometer
ESCALab MKII
X-ray photoelectron spectroscopy
-
TriStar 3020 BET analyzer
TriStar 3020
micromeritics
Specific surface area calculation
-
CHI660B electrochemical workstation
CHI660B
Chen Hua
Electrochemical analysis
-
Xe lamp
Light source for photocatalytic nitrogen fixation test
-
登录查看剩余7件设备及参数对照表
查看全部