研究目的
To elucidate the impact of additive engineering on n-type MAPbI3 film properties, specifically the role of PbI2 passivation, MASCN additive, grain size, and grain boundaries on solar cell performance.
研究成果
The study demonstrates that 5% excess PbI2 in the precursor solution leads to an improvement of the charge carrier recombination lifetime by an order of magnitude and an increase of the ambipolar diffusion length by a factor of three. Grain boundaries in MAPbI3 are nominally electronically benign under the synthesis conditions tested, and excess PbI2 more likely passivates defects within the grain interiors rather than at the grain boundaries.
研究不足
The study is limited to MAPbI3 films and may not be directly applicable to other perovskite materials. The impact of grain boundaries and additives may vary under different synthesis conditions.
1:Experimental Design and Method Selection:
A newly developed carrier-resolved photo-Hall (CRPH) characterization technique was used to study the impact of additives on MAPbI3 films.
2:Sample Selection and Data Sources:
MAPbI3 films were processed with and without excess PbI2 and MASCN additive to vary grain size.
3:List of Experimental Equipment and Materials:
Hall bars were fabricated by solution processing using methylammonium iodide (MAI), lead iodide (PbI2), N,N-dimethylformamide (DMF), and dimethyl sulfoxide (DMSO).
4:Experimental Procedures and Operational Workflow:
Films were spin-coated and annealed, then characterized using XRD, SEM, and CRPH measurements.
5:Data Analysis Methods:
The CRPH technique provided simultaneous access to majority and minority carrier properties, including carrier recombination lifetime and diffusion length, as a function of light intensity.
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Keithley 2400
2400
Keithley
Source Meter Unit (SMU) for current source
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Keithley 2001
2001
Keithley
Digital Multi Meter (DMM) for voltage measurement
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Keithley 7065
7065
Keithley
Hall switch matrix card for routing signals
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Keithley 617
617
Keithley
Electrometer for monitoring photodetector current
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N,N-dimethylformamide
DMF
Sigma-Aldrich
Solvent for precursor solution
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dimethyl sulfoxide
DMSO
Sigma-Aldrich
Solvent for precursor solution
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Bruker Dektak 150
Dektak 150
Bruker
Contact profilometer for measuring film thickness
-
Panalytical Empyrean
Empyrean
Panalytical
Powder diffractometer for XRD measurements
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Apreo S
Apreo S
ThermoFisher Scientific
Scanning electron microscope for top-view imaging
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Shimadzu UV-3600
UV-3600
Shimadzu
Spectrophotometer for UV–vis absorption spectroscopy
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methylammonium iodide
MAI
Dyesol
Precursor for MAPbI3 films
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lead iodide
PbI2
TCI chemicals
Precursor for MAPbI3 films
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methylammonium thiocyanate
MASCN
Dyesol
Additive to modify film grain structure
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Enlitech QE-R
QE-R
Enlitech
Quantum Efficiency/Reflectivity system for reflectivity measurements
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