研究目的
Investigating the use of alkylidene fluorene derivatives as non-fullerene acceptors in organic photovoltaics to achieve high open-circuit voltage.
研究成果
The synthesized AF-T-INCN and AF-T8-INCN were utilized as electron acceptors in the fabricated OPVs, with PTB7-Th as the donor. Although the performances were not significant, the device could be improved by matching with other donor polymers that would adopt a more favorable orientation with AF-T-INCN or AF-T8-INCN.
研究不足
The performances of the fabricated OPVs were not significant due to limited solubility and unfavorable polymer orientation in the film state.
1：Experimental Design and Method Selection:
Synthesis of alkylidene fluorene-based molecular acceptors AF-T-INCN and AF-T8-INCN for use in non-fullerene organic photovoltaics.
2：Sample Selection and Data Sources:
The synthesized acceptors were characterized using UV/Vis absorption spectroscopy, cyclic voltammetry, and DFT calculations.
3：List of Experimental Equipment and Materials:
Varian Mercury Plus (300 MHz spectrometer), UV-1800 UV–Vis spectrophotometer, Voyager DE-STR (Applied Biosystems), TA Instrument Q600, CH Instruments, Gaussian 09 W program package, 2D-GIXD, AFM, Oriel 1000 W solar simulator, Keithley 236 source-measure.
4：Experimental Procedures and Operational Workflow:
Fabrication of photovoltaic devices with ITO/PEDOT:PSS/PTB7-Th:acceptor/ZnO or LiF/Al structure.
5：Data Analysis Methods:
Analysis of optoelectrical properties, thermal properties, and photovoltaic performance.
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Varian Mercury Plus
300 MHz spectrometer
Varian
Obtaining 1H NMR and 13C NMR spectra
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UV-1800 UV–Vis spectrophotometer
Recording UV/Vis absorption behaviors
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Voyager DE-STR
Applied Biosystems
Measuring MALDI-TOF mass spectrometry
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TA Instrument Q600
Performing TGA and DSC
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CH Instruments
Obtaining cyclic voltammetry experiments
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Gaussian 09 W program package
Performing DFT calculations
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2D-GIXD
Measuring morphologies of thin films
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AFM
Obtaining height and phase images
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Oriel 1000 W solar simulator
Carrying out J–V characteristics
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Keithley 236 source-measure
Obtaining electronic data
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Xenon Short Arc Lamp
K3100 EQX
McScience
Measuring EQE
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Alpha-step
KP-10 surface profilometer
KNH Inc.
Obtaining the thickness of fabricated device layer
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