研究目的
Investigating the simulation and invalidation of hot-spot temperature distribution in micro-defective crystalline silicon solar cells.
研究成果
The simulation results show a good agreement with the experimental results with a relative deviation of 1.5% -10%. The worst case shading condition for a cell depends on the local reverse current caused by microdefects, and does not necessarily coincide with maximum total power dissipation. The temperature rise of hot spot cell with point defects is the highest.
研究不足
The simulations are based on pre-defined defect shapes. The reverse bias behavior at the numerous defects is not discussed and linked with the actual samples. The calculation model does not take into account the variation of heat transfer radiation, convection and other heat transfer factor between the cell and the external environment.
1：Experimental Design and Method Selection:
The study involves establishing mathematic models for hot spot thermal power of PV modules based on the distribution of reverse biased leakage current of micro-defective solar cells. ANSYS software is used for thermal simulation.
2：Sample Selection and Data Sources:
Micro-defect cells including cracked cells and low purity silicon cells are selected for testing.
3：List of Experimental Equipment and Materials:
Includes Fluke Ti401 PRO IR thermal camera for temperature distribution testing.
4：Experimental Procedures and Operational Workflow:
Involves setting up an experimental platform in outdoor conditions for testing different defective cells under various shading conditions.
5：Data Analysis Methods:
The relationship between the reverse bias current distribution and microdefect is analyzed, and ANSYS software is used to simulate the worst local temperature rise.
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