研究目的
To study the influence of nontoxic pyrite iron sulfide (FeS2) nanocrystals (NCs) incorporated into the PTB7:PC71BM active layer of bulk-heterojunction ternary organic photovoltaic (OPV) cells and to enhance the power conversion efficiency (PCE) of the OPV devices.
研究成果
The addition of 0.5 wt % FeS2 NCs to the PTB7:PC71BM active layer enhances the PCE of OPV devices by 21%, from 5.69% to 6.47%. This improvement is attributed to better charge generation, transport, and collection properties due to enhanced exciton dissociation and additional charge pathways.
研究不足
The performance enhancement is concentration-dependent, with optimal performance at 0.5 wt % FeS2. Higher concentrations lead to agglomeration and reduced efficiency. The study is limited to PTB7:PC71BM-based OPVs.
1:Experimental Design and Method Selection
The synthesis of FeS2 NCs using a two-pot method and their incorporation into the PTB7:PC71BM active layer at different weight ratios. The OPV devices were fabricated with the configuration glass/ITO/PEDOT:PSS/PTB7:PC71BM:FeS2/PFN/FM.
2:Sample Selection and Data Sources
FeS2 NCs were synthesized and added to the PTB7:PC71BM active layer at concentrations of 0, 0.25, 0.5, and 1.0 wt % with respect to the electron donor PTB7.
3:List of Experimental Equipment and Materials
Iron(II) chloride, octadecylamine, diphenyl ether, ITO covered glass substrates, PEDOT:PSS, PTB7, PC71BM, Field’s metal (FM).
4:Experimental Procedures and Operational Workflow
FeS2 NCs were synthesized, characterized, and incorporated into the active layer. OPV devices were fabricated by spin-coating the active layers and depositing the FM top electrode by drop casting.
5:Data Analysis Methods
Characterization techniques included TEM, SEM, STM, CV, UV–vis, FTIR, AFM, and IS. Statistical tests (Kruskal–Wallis and Mann–Whitney) were applied to analyze the PV parameters.
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Frontier MIR
MIR
Perkin Elmer
FTIR spectra recording
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Easyscan2
Easyscan2
Nanosurf
AFM measurements
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Sciencetech SS150
SS150
Sciencetech
Solar simulator
-
Keithley 2450
2450
Keithley
Source meter for current density versus voltage measurements
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JEOL JEM-1010
JEM-1010
JEOL
Transmission electron microscopy imaging
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JEOL JSM 7800F
JSM 7800F
JEOL
Scanning electron microscopy imaging
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Nanosurf Easyscan 2 STM
Easyscan 2 STM
Nanosurf
Scanning tunneling microscopy measurements
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Lambda 900
900
Perkin Elmer Instruments
UV–vis characterization
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PARSTAT 2273
2273
PARSTAT
Cyclic voltammetry measurements
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