研究目的
Investigating the impact of pre-fabrication treatments on n-type UMG wafers for improving the efficiency of silicon heterojunction solar cells.
研究成果
Pre-fabrication treatments significantly improve the bulk quality of UMG-Cz wafers, leading to higher efficiencies in silicon heterojunction solar cells. The bulk lifetime is identified as the primary limiting factor for UMG-Cz wafers.
研究不足
The study highlights the need for high-quality wafers as starting materials for silicon heterojunction solar cells due to their low-temperature processing. The bulk lifetime remains a limiting factor for UMG-Cz wafers despite pre-fabrication treatments.
1:Experimental Design and Method Selection:
The study involved fabricating rear-junction silicon heterojunction solar cells on both as-grown and pre-treated UMG-Cz and electronic-grade wafers. Pre-fabrication treatments included tabula rasa, phosphorus diffusion gettering, and hydrogenation.
2:Sample Selection and Data Sources:
UMG-Cz wafers grown by Apollon Solar and commercially available EG-Cz wafers were used. Properties such as resistivities, dopant concentrations, and interstitial oxygen concentrations were measured.
3:List of Experimental Equipment and Materials:
Equipment included a Bruker Vertex 80 tool for FTIR, a WCT-120 tool from Sinton Instruments for carrier lifetime measurements, and an Applied Materials P-5000 multi-chamber PECVD tool for a-Si:H layer deposition.
4:Experimental Procedures and Operational Workflow:
Wafers underwent pre-fabrication treatments, were cleaned, textured, and then a-Si:H layers were deposited. ITO and silver were sputtered, and grids were screen printed for current collection.
5:Data Analysis Methods:
Carrier lifetimes were measured using QSSPC and transient PCD techniques. J-V measurements were performed under standard conditions, and EQE spectra were measured.
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