研究目的
Investigating the mechanically controlled reversible photoluminescence response in all-inorganic flexible transparent ferroelectric/mica heterostructures.
研究成果
The study demonstrates a purely mechanical strain-induced and repeatable control of the photoluminescence response using a simple BCTZ:Pr/mica epitaxial structure. The structure possesses high optical transmittance and excellent mechanical flexibility, with no noticeable decay after being bent for 104 cycles. This finding is informative for achieving mechanically controlled photoluminescence properties in lattice-sensitive ferroelectric oxides and designing next-generation all-inorganic, reconfigurable, light weight, transparent, and flexible passive luminescent devices.
研究不足
The study is limited to the specific material system of Pr-doped Ba0.85Ca0.15Ti0.9Zr0.1O3 epitaxial films on mica substrates. The mechanical strain effect on photoluminescence response may vary for other material systems.
1:Experimental Design and Method Selection:
The study involved the fabrication of transparent and flexible Pr-doped Ba0.85Ca0.15Ti0.9Zr0.1O3 epitaxial films on mica substrates using the pulsed laser deposition technique. The effect of mechanical strain on their photoluminescence properties was investigated.
2:85Ca15Ti9Zr1O3 epitaxial films on mica substrates using the pulsed laser deposition technique. The effect of mechanical strain on their photoluminescence properties was investigated.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: The BCTZ:Pr ceramic target was ablated at 700 °C under 10 Pa pure oxygen with a KrF excimer laser. The film was postannealed in situ at 700 °C in an oxygen pressure of 103 Pa for 30 min.
3:List of Experimental Equipment and Materials:
X-ray diffraction (XRD, SmartLab, Rigaku Co., Japan), scanning probe microscopy (SPM, Asylum MFP 3D Infinity), UV–vis spectrometer (Shimadzu Co.), Edinburgh FLSP920 spectrophotometer with a 450-nm xenon arc lamp (Xe900).
4:0).
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The crystal structure and epitaxial nature of the as-grown BCTZ:Pr/mica sample were examined by XRD. The surface morphology was characterized using SPM. The transmittance spectra were recorded using a UV–vis spectrometer. The PL excitation and emission spectra were measured using an Edinburgh FLSP920 spectrophotometer.
5:Data Analysis Methods:
The PL emission spectra of the structure in different bent states as well as the flat state were recorded under an excitation of 468 nm. The bending strain ε in the BCTZ:Pr film was described as ε = t/R, where t is the half of the total thickness of the film and the mica substrate and R is the radius of curvature.
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