研究目的
To investigate the spatial distribution of oxygen functional groups on monolayer and multilayer graphene oxide (GO) using AFM-IR, overcoming the conventional IR diffraction limit for several micrometers.
研究成果
AFM-IR provides a novel, label-free spectroscopic approach to characterize and identify the chemical functionality on monolayer and multilayer GO with high spatial resolution. The technique allows for the observation of oxygen functional groups' distribution on GO, contributing to the understanding of GO structure-properties relations and enabling targeted applications.
研究不足
The study is limited by the sample preparation method and the specific conditions under which AFM-IR measurements were conducted. Potential areas for optimization include improving the uniformity of GO samples and further enhancing the spatial resolution of AFM-IR.