研究目的
To study the preparation of fluoroalkyl end-capped vinyltrimethoxysilane oligomeric silica/h-BN nanocomposites and their application in the surface modification of PMMA, focusing on the unique properties imparted by h-BN on the modified surface.
研究成果
The study successfully prepared two kinds of RF-(VM-SiO2)n-RF/h-BN nanocomposites under different conditions, which exhibited good dispersibility and were applied to PMMA surface modification. The nanocomposites prepared under alkaline conditions showed oleophobic and fluorescent properties on the surface side, while those under acidic conditions showed these properties on both sides. This controlled surface modification opens new possibilities for fluorinated functional polymeric materials.
研究不足
The study focuses on the surface modification of PMMA films and the unique properties imparted by h-BN, but the broader applicability and scalability of the method may require further investigation.
1:Experimental Design and Method Selection:
The study involved the sol–gel reactions of fluoroalkyl end-capped vinyltrimethoxysilane oligomer in the presence of h-BN nanoparticles under alkaline or acidic conditions at room temperature.
2:Sample Selection and Data Sources:
Hexagonal boron nitride (h-BN) nanoparticles were used, and the nanocomposites were characterized using various techniques.
3:List of Experimental Equipment and Materials:
Equipment included dynamic light scattering (DLS) measurements, field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), Fourier-transform infrared (FTIR) spectra, thermal analyses, contact angle measurements, fluorescent spectra measurements, and solid-state NMR spectra.
4:Experimental Procedures and Operational Workflow:
The nanocomposites were prepared and applied to PMMA films, followed by characterization of their properties.
5:Data Analysis Methods:
The data were analyzed to understand the surface modification effects and the properties of the nanocomposites.
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Transmission electron microscopy (TEM)
JEM-1210
JEOL
Conducting transmission electron microscopy
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Fourier-transform infrared (FTIR) spectra
FTIR-8400
Shimadzu
Measuring Fourier-transform infrared spectra
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Fluorescent spectra
RF-5300 PC
Shimadzu
Obtaining fluorescent spectra
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Optical and fluorescence microscope images
BX51
Olympus Corp.
Obtaining optical and fluorescence microscope images
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Field emission scanning electron microscopy (FE-SEM)
JSM-7000F
JEOL
Obtaining field emission scanning electron micrographs
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Dynamic light scattering (DLS) measurements
DLS-7000 HL
Otsuka Electronics
Measuring the size of nanocomposite particles
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X-ray diffraction (XRD) measurements
MiniFlex 600
Performing X-ray diffraction measurements
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Thermal analyses
TG-DTA2010SEa
NETZSCH JAPAN
Recording thermal analyses
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Contact angles
Drop Master 300
Kyowa Interface Science
Measuring contact angles
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Solid-state nuclear magnetic resonance (NMR) spectra
Varian 400 NMR system spectrometer
Varian
Measuring solid-state NMR spectra
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