研究目的
Investigating the utilization of pulsed laser deposition (PLD) for the preparation of CdS thin films and CdS/Cu(In,Ga)Se2 heterojunction structures on soda-lime glass (SLG) and Mo-coated SLG substrates, respectively, under various process conditions.
研究成果
High-quality CdS/CIGS diodes can be obtained using pulsed laser deposition in a single-step growth process, eliminating the need for selenization of CIGS and the use of other growth techniques for CdS. The best quality diodes were grown at CdS deposition temperatures of 200 and 300oC.
研究不足
The study focuses on the optimization of PLD growth parameters for CdS and CIGS layers, but scalability to industrial production and long-term stability of the heterojunctions were not addressed.
1:Experimental Design and Method Selection:
PLD was used for the deposition of CdS and CIGS films. The influence of laser fluence and deposition temperature on the properties of CdS thin films was investigated.
2:Sample Selection and Data Sources:
CdS thin films were deposited on bare SLG substrates and sequential deposition of CIGS followed by CdS on Mo-coated SLG substrates.
3:List of Experimental Equipment and Materials:
A KrF excimer laser source was used for PLD. Commercially available Mo-coated SLG substrates were used.
4:Experimental Procedures and Operational Workflow:
The deposition was carried out in a high-vacuum chamber with Argon background gas. The number of pulses, repetition rate, and target to substrate distance were kept constant.
5:Data Analysis Methods:
Structural, compositional, morphological characterization, along with electrical and optical measurements were performed.
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X-ray diffractometer
SmartLab RIGAKU
RIGAKU
Used to identify the crystal phases present in the films.
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Field emission gun SEM
Zeiss Supra 35VP
Zeiss
Used for morphological and elemental analysis of the CdS/CIGS/Mo/SLG films.
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Spectrophotometer
Lamda 1050
Perkin Elmer
Used for optical absorption measurements.
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KrF excimer laser source
λ = 248 nm, τ ≤ 25 ns
Used for pulsed laser deposition of CdS and CIGS films.
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Stylus profilometer
Used to measure the thickness of CdS films.
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Energy dispersive X-ray spectroscopy
Jeol JSM-6610 LV, Bruker Nano 129eV, XFlash 5010 EDS detector
Jeol, Bruker
Used for planar chemical composition analysis of CdS films.
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Diode laser
375 nm
Oxxius
Used for excitation in steady-state photoluminescence measurements.
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Spectrofluorimeter
FluoroLog FL3
Horiba Jobin Yvon
Used for spectral analysis and detection of luminescence.
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