研究目的
Investigating the challenges and advances in using reconfigurable systems reliably in harsh environments, focusing on the effects of radiation on FPGA-based systems and summarizing the challenges in deploying FPGAs in such environments.
研究成果
The in-system reconfigurability, high logic density, and high-speed I/O of modern FPGAs make them ideal for spacecraft and high-energy physics experiments. A variety of well-known and proven SEU mitigation techniques has been applied to FPGA-based systems and successfully demonstrated in radiation environments. The success of these techniques has facilitated FPGAs being used in space applications, high-energy physics experiments, and high-reliable terrestrial applications.
研究不足
The paper does not explicitly mention the limitations of the research, but it can be inferred that the challenges of using FPGAs in radiation environments include the sensitivity of FPGAs to radiation, the complexity of implementing mitigation techniques, and the need for continuous monitoring and repair of upsets in the configuration memory.
1：Experimental Design and Method Selection:
The paper discusses the effects of radiation on FPGA-based systems and summarizes the challenges in deploying FPGAs in radiation environments. It describes several well-known mitigation methods and the unique ability of FPGAs to customize the system for improved reliability.
2：Sample Selection and Data Sources:
The paper uses case studies of successful deployment of FPGAs in radiation environments, including space systems and high-energy physics experiments.
3：List of Experimental Equipment and Materials:
The paper mentions the use of Xilinx 7 Series Kintex 325-T FPGA and other FPGA types (antifuse, flash, and SRAM-based FPGAs).
4：Experimental Procedures and Operational Workflow:
The paper describes the process of mitigating the effects of radiation on FPGA-based systems, including hardware redundancy, configuration scrubbing, error-correction coding, and flip-flop mitigation.
5：Data Analysis Methods:
The paper discusses the use of fault injection to estimate the sensitivity of configuration bits and the effectiveness of TMR and related techniques.
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