研究目的
Investigating the processing friendly slot-die cast non-fullerene organic solar cells with optimized morphology for high efficiency.
研究成果
The slot-die coated devices without thermal annealing exhibited a high PCE of 12.5%, attributed to the highest degree of crystallinity, smallest domain size, and purest phase. The technique shows great potential for large-scale roll-to-roll fabrication of OSCs due to its simplicity and high performance.
研究不足
The study focuses on the PBDB-T:i-IEICO-4F blend and may not be directly applicable to other material systems. The slot-die coating process requires optimization of parameters such as substrate temperature and coating speed, which could limit its immediate scalability.
1:Experimental Design and Method Selection:
The study involved the fabrication of organic solar cells (OSCs) using spin-coating, blade-coating, and slot-die coating techniques. The slot-die coating was highlighted as a lab-scale version of roll-to-roll fabrication suitable for large-scale production.
2:Sample Selection and Data Sources:
The active layer solution was prepared using PBDB-T and i-IEICO-4F in chlorobenzene.
3:List of Experimental Equipment and Materials:
Instruments included a Shimadzu UV-3600 Plus Spectrophotometer for UV-Vis absorption spectrum, a surface profilometer (Dektak XT, Bruker) for film thickness measurement, and a Keithley 2400 source meter unit for J-V characteristics.
4:Experimental Procedures and Operational Workflow:
The BHJ devices were fabricated with an inverted structure of Glass/ITO/ZnO/PBDB-T:i-IEICO-4F/MoO3/Al. The active layer was coated by spin-coating, blade-coating, or slot-die coating in ambient conditions.
5:Data Analysis Methods:
The crystalline coherence length (CCL) was extracted from 2D GIWAXS scattering patterns using the Scherrer equation. The hole and electron mobilities were measured using the space charge-limited current (SCLC) method.
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Shimadzu UV-3600 Plus Spectrophotometer
UV-3600 Plus
Shimadzu
UV-Vis absorption spectrum measurement
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Surface Profilometer
Dektak XT
Bruker
Film thickness measurement
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Keithley 2400 Source Meter Unit
2400
Keithley
J-V characteristics measurement
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AAA Solar Simulator
SS-F5-3A
Enli Technology CO., Ltd.
Solar cell performance measurement
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Solar Cell Spectral Response Measurement System
QE-R3018
Enli Technology CO., Ltd.
EQE measurement
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