研究目的
Investigating the damage process of indium tin oxide (ITO) transparent conductive thin film and polyimide (PI) alignment thin film coated on fused silica substrates under high-repetition-rate laser irradiation.
研究成果
The study demonstrated that high-repetition-rate laser irradiation causes specific damage morphologies in ITO and PI films, primarily due to thermal effects. The damage threshold decreases with increasing irradiation time, indicating a cumulative heating effect.
研究不足
The study focused on specific laser parameters and materials, and the damage mechanisms may vary under different conditions. The simulation simplified some thermal properties and boundary conditions.
1：Experimental Design and Method Selection:
The study involved irradiating PI/ITO/SUB samples with a 1064 nm high-repetition-rate laser to observe damage morphologies and simulate temperature-rise effects.
2：Sample Selection and Data Sources:
Samples consisted of fused silica substrates coated with ITO and PI films. Damage features were observed using an optical profiler.
3：List of Experimental Equipment and Materials:
A Nd:YAG high-repetition-rate laser, optical profiler (WYKO NT9100), and stylus profiler were used.
4：Experimental Procedures and Operational Workflow:
The samples were irradiated at various power densities and irradiation times, and the resulting damage was characterized.
5：Data Analysis Methods:
Thermal modeling was performed to simulate temperature-rise and understand the damage mechanisms.
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