摘要： Selective laser melting (SLM) is known to generate large and anisotropic residual stresses in the samples. Accurate measurement of residual stresses on SLM-produced samples is essential for understanding the residual stress build-up mechanism during SLM, while a dramatic fluctuation can be observed in the residual stress values reported in the literature. On the basis of studying the influence of surface roughness on residual stress measured using X-ray diffraction (XRD), we propose a procedure coupling XRD technique with pretreatment consisting of mechanical polishing and chemical etching. The results highlight that residual stresses measured using XRD on as-built SLM-produced samples with high surface roughness are significantly lower than those measured on samples with finished surface, which is due to the stress relaxation on the spiked surface of as-built samples. Surface distribution of residual stresses and the effect of scanning strategy were systematically investigated for SLM-produced AlSi10Mg samples. Microstructural morphology was observed at the interface between sample and building platform and was linked to the surface distribution of residual stresses. This procedure can help us accurately measure the residual stresses in SLM-produced samples and thus better understand its build-up mechanism during the SLM process.