研究目的
To investigate the impact of indium doping on the power conversion efficiency (PCE) of flexible Cu2ZnSn(S,Se)4 (CZTSSe) solar cells by partially substituting Sn4+ with In3+.
研究成果
An elemental precursor solution method has been successfully adopted to prepare CZTISSe thin films on Mo foils by partially substituting Sn4+ with In3+. Doping In can improve the crystallinity and semiconducting properties of the films. Partially replacing Sn with In can produce shallow level defects of InSn and reduce Sn-related defects such as SnCu and SnZn, thus improving the Voc and carrier transport characteristics. Finally, a PCE up to 7.19% has been achieved for the flexible CZTISSe solar cell with the In-doped content of x ? 9%, which is 2.78% higher than that of the undoped solar cell. The Voc is increased by 62 mV due to lower Voc,def and defects.
研究不足
The study focuses on the impact of indium doping on the performance of CZTSSe solar cells, but does not explore the long-term stability or scalability of the fabrication process. Additionally, the effect of other dopants or combinations of dopants is not investigated.
1:Experimental Design and Method Selection:
An elemental precursor solution method was adopted for preparing Cu2ZnSn1-xInx(S,Se)4 (CZTISSe) thin films on Mo foils by doping In with varied x values (x ? In/(In t Sn)). Solar cells with a structure of Ag/ITO/i-ZnO/CdS/CZTISSe/Mo foil were fabricated and their photovoltaic properties were systematically investigated.
2:Sample Selection and Data Sources:
Mo foils were potentiostatically polished in methanol and sulfuric acid mixed solution. The CZTISSe thin films were fabricated on Mo foils by green solution-process.
3:List of Experimental Equipment and Materials:
Cu, Zn, Sn, In, S, and Se powders were used as received without further purification. The scanning electron microscope (SEM) images were collected by a Nova Nano field-emission SEM 450 with an energy dispersive X-ray (EDX) analyzer. The X-ray diffraction (XRD) patterns were obtained by a Rigaku Smartlab. Raman spectra were measured via Renishaw Raman microscope with excitation wavelength of 532 nm and 325 nm, respectively.
4:Experimental Procedures and Operational Workflow:
The CZTSSe and CZTISSe precursor films were prepared by spin-coating the precursor solution on the Mo foils and then selenized in a cylindrical graphite box with Se pellets at 550°C for 15 min. The samples of the films were named as In x, which means film with x concentration (x ? In/(Sn t In) ? 0, 3, 6, 9 and 12%).
5:Data Analysis Methods:
The current density-voltage (J-V) curves were measured by a Keithley 2400 source meter under AM1.5 illumination. The external quantum efficiency (EQE) curves were collected by a Zolix SCS100 QE system under a 150 W xenon light source. The capacitance-voltage (C–V) curves were measured by a Keithley 4200 semiconductor characterization system.
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