研究目的
Investigating the enhancement of photoresponsivity in a plasmonic-enhanced nanostructure photodetector based on multilayer molybdenum disulfide (MoS2) deposited on p-type Silicon (Si) substrates.
研究成果
The plasmonic-enhanced hybrid nanostructure MoS2 Si PD significantly improves photoresponsivity across a broad wavelength range, demonstrating potential applications in Si photovoltaics and visible range photo sensing. The light trapping effect between the MoS2 layer and silicon substrate enhances light absorption and electron-hole pair generation.
研究不足
The study is constrained by the inherent atomic thickness of monolayer MoS2, which limits light absorption, and the positioning of metal nanostructures that can induce high reflection losses. The fabrication process for large-area MoS2 deposition requires high precision and can be costly.
1:Experimental Design and Method Selection:
The study involves the fabrication of a large-area plasmonic-enhanced nanostructure photodetector using a modified membrane filtration method for depositing multilayer MoS2 on p-type Si substrates. Gold nanoparticles (Au NSs) are used to enhance the coupling of incident light.
2:Sample Selection and Data Sources:
p-type Si substrates are used, with Au NSs prepared using a standard dewetting process. MoS2 solution is prepared from MoS2 ultrafine powder using the liquid phase exfoliation (LPE) technique.
3:List of Experimental Equipment and Materials:
Equipment includes an e-Beam evaporator for Au deposition, rapid thermal annealing (RTA) for Au NSs formation, ultrasonic cleaner, high power sonicator, centrifuge, and hot plate. Materials include MoS2 ultrafine powder, bile salt surfactant, deionized (DI) water, and buffer oxide etchant (BOE).
4:Experimental Procedures and Operational Workflow:
The process involves sonication, centrifugation, and modified membrane filtration for MoS2 deposition, followed by heating to attach the MoS2 layer firmly to the Au NSs structure.
5:Data Analysis Methods:
Characterization includes FESEM and Raman scattering analysis for material properties, and electrical characterization for photocurrent and dark current measurements.
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