研究目的
To investigate the impact of the dispersing agent's viscosity and volatility on the materials and carrier transport properties of spin-coated ZnO NP thin films used as electron transport layers (ETLs) in quantum dot light emitting diodes (QLEDs).
研究成果
The use of ethanol as the dispersing agent for ZnO NPs results in the smoothest and most compact ETL, leading to QLEDs with superior efficiency and lowest leakage current. The study highlights the critical roles of solvent viscosity and volatility in the formation of high-quality NP-based thin films for optoelectronic applications.
研究不足
The study is limited to the first four members of the alkanol family as dispersing agents. The findings may not be directly applicable to other solvents or NP systems without further investigation.
1:Experimental Design and Method Selection:
The study compared the first four members of the alkanol family (methanol, ethanol, propanol, and butanol) as dispersing agents for ZnO NPs to study their impact on film quality and device performance.
2:Sample Selection and Data Sources:
ZnO NPs were synthesized and dispersed in different alcohols. QLEDs were fabricated with these ZnO NP thin films as ETLs.
3:List of Experimental Equipment and Materials:
Instruments included X-ray diffraction (XRD), transmission electron microscopy (TEM), focused ion beam scanning electron microscope (FIB-SEM), field emission scanning electron microscopy (FESEM), atomic force microscope (AFM), and a semiconductor device analyzer for electrical measurements.
4:Experimental Procedures and Operational Workflow:
ZnO NPs were spin-coated onto ITO substrates, followed by deposition of QDs and other functional layers to complete the QLED structure. The devices' optoelectronic performances were then measured.
5:Data Analysis Methods:
The surface morphology, roughness, and electrical properties of the ZnO NP films were analyzed to correlate with the QLEDs' performance.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Atomic force microscope
Dimension Icon
Bruker
Characterization of surface morphology and roughness of the ZnO films
暂无现货
预约到货通知
-
Constant current source
Model 2400
Keithley
Measurement of device performances, including current density, luminance and current efficiency
暂无现货
预约到货通知
-
X-ray diffraction
Smartlab
Rigaku
Characterization of crystal structure and size distributions of ZnO NPs
暂无现货
预约到货通知
-
Transmission electron microscopy
Talos F200X
FEI
Characterization of crystal structure and size distributions of ZnO NPs
暂无现货
预约到货通知
-
Focused ion beam scanning electron microscope
CrossBeam
Carl Zeiss
Evaluation of the thickness of each functional layer in the multilayered QLED structure
-
Field emission scanning electron microscopy
Sigma
Zeiss
Characterization of surface morphology and roughness of the ZnO films
-
Luminance meter
LS-160
Konica Minolta
Measurement of device performances, including current density, luminance and current efficiency
暂无现货
预约到货通知
-
登录查看剩余5件设备及参数对照表
查看全部