研究目的
Investigating the microstructural growth and efficiency improvement of inkjet printed CIGS thin film solar cells through optimized selenization time.
研究成果
Optimized selenization time of 14 min resulted in significant improvement in device efficiency from 0.4% to 4.2%. The study provides insights into the growth mechanism of CIGS films and the impact of selenization time on film microstructure and device performance.
研究不足
The study is limited by the non-uniform inter-diffusion of In and Ga during selenization, leading to double-layered CIGS structure, and the formation of MoSe2 at the CIGS-Mo interface affecting device performance.
1:Experimental Design and Method Selection:
The study involves inkjet printing of precursor films followed by selenization using rapid thermal processing (RTP) under atmospheric pressure.
2:Sample Selection and Data Sources:
Precursor films were printed on Mo-coated SLG substrates, with selenization time varied from 2 min to 24 min.
3:List of Experimental Equipment and Materials:
Rapid thermal processing system, X-ray diffraction (XRD), Raman Spectrometer, X-ray fluorescence spectrometer, Field emission scanning electron microscopy (FESEM), Atomic force microscopy (AFM), Impedance equipment, Solar simulator.
4:Experimental Procedures and Operational Workflow:
Precursor films were selenized in a closed graphite box with Se pellets, using a two-step selenization process.
5:Data Analysis Methods:
Structural and phase analysis via XRD and Raman, morphological studies via FESEM and AFM, electrical properties via impedance measurements, and device performance via current-voltage characteristics and EQE measurements.
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Field emission scanning electron microscopy
Gemini-500
ZEISS
Morphological studies
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Rapid thermal processing system
Qualflow-Therm
France
Selenization of printed films
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X-ray diffraction
RIGAKU Corp.
Japan
Structural and phase analysis
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Raman Spectrometer
Brucker SENTERRA
Phase purity and carbon impurity analysis
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X-ray fluorescence spectrometer
XDV-SDD
Helmut Fischer
Elemental compositional analysis
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Atomic force microscopy
Park NX 10
Topography measurement
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Impedance equipment
Solartron SI 1260
Electrical properties measurement
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Solar simulator
94123A
Oriel Instruments
Device testing
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External quantum efficiency measurement system
Bentham PVE 300
EQE measurement
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