研究目的
To investigate the influence of the modification of annealing parameters on solution-processed metal oxide ETL buffer layers, and to conduct a comparative study of spin-coated and thermally evaporated MoOx HTL for use in an inverted polymer solar cell.
研究成果
The study successfully demonstrated the fabrication of highly transparent ETLs using solution processing techniques. The performance of OSCs was found to be significantly influenced by the surface morphology of the ETLs, with textured ETLs showing better photovoltaic performance. The method of producing the MoOx HTL also had a significant impact on device performance, with thermally evaporated MoOx HTL showing superiority over solution-processed MoOx HTL.
研究不足
The study notes the difficulty in achieving full coverage of the solution-coated MoOx HTL, which may lead to current leakage and reduced device performance. The insulating nature of MoOx thin films greater than 10 nm could also reduce the short-circuit current, affecting the power conversion efficiency.
1:Experimental Design and Method Selection
The study employed the sol-gel spin coating method for synthesizing transparent metal oxide thin films on ITO substrates. The annealing temperature was varied to investigate its effect on the morphological properties of the thin films. The HTL layer was prepared using both spin-coating and thermal evaporation methods for comparison.
2:Sample Selection and Data Sources
The samples consisted of ZnO, TiO2, and MoOx thin films synthesized on ITO substrates. The active layers were blends of P3HT and PCBM.
3:List of Experimental Equipment and Materials
A scanning electron microscope (SEM) equipped with energy dispersive spectroscopy (EDS) capability, UV–Vis spectroscopy, X-ray diffraction (XRD), and a LabVIEW controlled Keithley 2400 source meter were used for characterization.
4:Experimental Procedures and Operational Workflow
The thin films were synthesized via sol-gel spin coating, followed by annealing at varying temperatures. The HTL was prepared using both spin-coating and thermal evaporation. The devices were characterized for their optical, morphological, and electrical properties.
5:Data Analysis Methods
The optical properties were analyzed using UV–Vis spectroscopy, the surface morphology was studied using SEM, and the crystal structures were investigated using XRD. The device performance was measured under illumination of AM 1.5G.
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