研究目的
Investigating the synthesis of graphene quantum dots (GQDs) with high yield and high quality from a low-cost precursor of aphanitic graphite (AG).
研究成果
AG was successfully used as a low-cost precursor for the synthesis of GQDs with high yield and high quality. The process does not require high-strength cutting, and the size of the GQDs can be controlled. The GQDs can be easily modified for specific applications, such as fluorescent probes for metal ion detection.
研究不足
The study focuses on the synthesis and characterization of GQDs from AG, but the scalability of the process and the long-term stability of the GQDs in various applications need further investigation.
1:Experimental Design and Method Selection:
The synthesis of GO-QDs was carried out by a conventional intercalation process, using AG as the precursor. The process involved ultrasonication, oxidation with KMnO4, and hydrothermal treatment to obtain GQDs with different surface properties.
2:Sample Selection and Data Sources:
AG and flake graphite (FG) were used as precursors. The products were characterized using XRD, Raman spectroscopy, SEM, TEM, AFM, FTIR, TG, XPS, and PL measurements.
3:List of Experimental Equipment and Materials:
Equipment included an ultrasonic mixer, ice bath, centrifuge, Te?on-line autoclave, XRD diffractometer, SEM, TEM, AFM, Raman microscope, thermal analyzer, XPS instrument, FTIR spectrometer, and PL spectrometer. Materials included AG, FG, NaNO3, H2SO4, KMnO4, H2O2, and various functional molecules for modification.
4:Experimental Procedures and Operational Workflow:
The procedure involved the exfoliation of AG, oxidation, hydrothermal treatment for modification, and characterization of the products.
5:Data Analysis Methods:
The data were analyzed using various spectroscopic and microscopic techniques to determine the size, thickness, yield, and properties of the GO-QDs and GQDs.
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X-ray powder diffractometer
Bruker D8 Advance
Bruker
Identifying the crystalline phases of the samples
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Field emission scanning electron microscope
Hitachi S4800
Hitachi
Characterizing the morphologies of the samples
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Transmission electron microscope
Tecnai G2 F30 S-Twin
FEI
Characterizing the morphologies of the samples
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Fourier transform infrared spectra
PerkinElmer spectrum 100
PerkinElmer
Obtaining FI-IR spectra
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PL lifetimes and quantum yield
LSP920
Edinburgh Instruments
Investigating PL lifetimes and quantum yield
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Atomic force microscope
Cypher ES
Asylum Research, Oxford Instrument
Obtaining the morphology and thickness of GO-QDs
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Raman microscopy
Horiba, LabRAM HR Evolution
Horiba
Recording Raman spectra
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Thermal analyzer
NETZSCH
NETZSCH
Conducting thermogravimetric analyses
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X-ray photoelectron spectroscopy
PHI-5000 Versa Probe
ULVAC-PHI
Carrying out XPS
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