研究目的
Investigating the photoelectric properties and potential applications of p-doped WSe2/MoTe2 van der Waals heterostructure as a photovoltaic device.
研究成果
The p-doped WSe2/MoTe2 heterostructure exhibits excellent photoelectric properties, including a high on/off ratio, low dark current, and fast response time, making it a promising candidate for nanoscale optoelectronic devices. The laser-induced p-doping method offers a novel approach to enhance device performance.
研究不足
The study is limited by the precision of laser doping and the thickness control of p-doped WSe2, which could affect the performance and reproducibility of the photovoltaic device.
1:Experimental Design and Method Selection
A 633 nm laser was used for scanning the surface of WSe2 to obtain p-doped WSe2. X-ray photoelectron spectroscopy (XPS) and electrical measurements were employed to verify p-type doping.
2:Sample Selection and Data Sources
Multilayer MoTe2 and WSe2 nanoflakes were prepared using the mechanical exfoliation technique.
3:List of Experimental Equipment and Materials
Raman spectroscopy (Renishaw inVia), atomic force microscopy (AFM) (Dimension 3100, Veeco), HRTEM (JEM -2100F/EDS), XPS (Thermo ESCALAB 250XI), semiconductor parameter analyzer (Agilent B1500A), high-speed oscilloscope (Agilent 86100A).
4:Experimental Procedures and Operational Workflow
The laser-scanned WSe2 was characterized by HRTEM, EDS, and XPS. A photovoltaic device was fabricated using p-doped WSe2 and MoTe2, and its performance was evaluated under illumination.
5:Data Analysis Methods
The band structure, light-matter reactions, and carrier-transport in the p-doped WSe2/MoTe2 heterojunction were analyzed to understand its photoelectric properties.
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High-speed oscilloscope
Agilent 86100A
Agilent
Capture the accurate response time
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Atomic force microscopy
Dimension 3100
Veeco
Characterization of multilayer MoTe2 and WSe2 nanoflakes
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HRTEM
JEM -2100F/EDS
JEOL
Investigation of the nanostructure of multilayer WSe2
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X-ray photoelectron spectroscopy
Thermo ESCALAB 250XI
Thermo Fisher Scientific
Identification of production of WOx and analysis of surface composition
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Semiconductor parameter analyzer
Agilent B1500A
Agilent
Electrical measurements of the device
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Raman spectroscopy
Renishaw inVia
Renishaw
Characterization of multilayer MoTe2 and WSe2 nanoflakes
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