研究目的
Investigating the design and robustness of a broadband dual-polarized transition from PCB to circular dielectric waveguide for mm-wave applications.
研究成果
The presented broadband dual-polarized transition design demonstrates competitive performance in terms of bandwidth and insertion loss, with robustness against manufacturing tolerances. The sensitivity analysis highlights key parameters affecting the transition's electrical properties, guiding future optimizations for mass production.
研究不足
The study identifies the distance between the primary and stacked patches as a critical parameter sensitive to manufacturing tolerances, particularly the air gap between PCB and dielectric structure. The design's performance is optimized for a specific frequency range (75–110 GHz), and its applicability to other frequency bands may require further investigation.
1:Experimental Design and Method Selection:
The study utilizes a stacked-patch topology to design a transition between microstrip lines (MSLs) and circular dielectric waveguides (DWGs), focusing on reducing space consumption and improving coupling efficiency without additional metallic apertures.
2:Sample Selection and Data Sources:
Prototypes are manufactured, including PCBs with primary patch structures and dielectric structures with stacked patches, to validate the design through measurements.
3:List of Experimental Equipment and Materials:
Equipment includes a vector network analyzer (Agilent N55250 PNA with N5260-6003 test sets), Rogers 3003 substrate, and HDPE dielectric waveguides.
4:Experimental Procedures and Operational Workflow:
The transition's performance is evaluated through S-parameter measurements, including transmission coefficients, isolation, and crosstalk, across various combinations of PCBs and dielectric structures.
5:Data Analysis Methods:
A sensitivity analysis using the Taguchi Method assesses the impact of manufacturing tolerances on the transition's electrical properties.
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