研究目的
Investigating the flexible engineering of light emission in monolayer MoS2 via direct laser writing for multimode optical recording.
研究成果
A flexible direct laser writing approach was proposed to engineer PL properties of monolayer MoS2 and presented its promising applications in multimode optical recording. The precise control of PL spectra enables a WDM scheme for high-capacity information technologies and flexible micro-photonic devices.
研究不足
The repeatability of engineering is unsatisfactory due to the rather different qualities of the monolayer materials. The spatial resolution was about 3 μm, limited by the thermal diffusion effect during the writing process. The accurate recording must be writing, storing, and reading under the same atmospheric condition due to the sensitivity of PL spectra to the gas molecules.
1：Experimental Design and Method Selection:
A flexible direct laser writing approach was designed to engineer the photoluminescence (PL) properties of monolayer MoS2. A continuous-wave (CW) 532 nm laser was used for both writing and reading the optical recording.
2：A continuous-wave (CW) 532 nm laser was used for both writing and reading the optical recording.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Monolayer MoS2, synthesized on the SiO2/Si substrate by chemical vapor deposition (CVD), was used. The quality of the samples was characterized by optical and atomic force microscopy.
3：List of Experimental Equipment and Materials:
A home-built scanning confocal microscope was used for direct laser writing, PL imaging, and spectra measurements. A dry objective (100×, 0.9NA) was used to focus the laser on the sample surface.
4：9NA) was used to focus the laser on the sample surface.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The laser was tightly focused on the sample surface, and optical recording was achieved by moving the MoS2 sample with respect to the focused laser beam in a programmable way.
5：Data Analysis Methods:
PL spectra were analyzed to determine the peak energy distributions of neutral exciton (A0) and charged exciton (trion, AT) for each spot.
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