研究目的
Comparison between Direct Current (DC) and High Power Impulse Magetron Sputtering (HiPIMS) processes for nickel thin films deposition.
研究成果
HiPIMS technology produces denser and better crystallized nickel thin films with improved uniformity on substrates with complex geometries compared to DC technology.
研究不足
The deposition rates in HiPIMS are low, which could be a limitation for industrial transfer.
1:Experimental Design and Method Selection:
The study compares DC and HiPIMS discharges by mass spectrometry and the intrinsic properties of coatings developed by these two techniques.
2:Sample Selection and Data Sources:
Thin nickel films were deposited on silicon (100) substrates with complex geometries.
3:List of Experimental Equipment and Materials:
JEOL JSM 7600F scanning electron microscope for thickness measurements.
4:Experimental Procedures and Operational Workflow:
Deposition rates and uniformity were measured for both DC and HiPIMS processes.
5:Data Analysis Methods:
Density measurements by gravimetry and X-ray diffraction for crystallinity analysis.
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