研究目的
To fabricate flexible, lightweight and low-cost h-BNNPs/PVDF nanocomposite films for EMI shielding applications.
研究成果
The h-BNNPs/PVDF nanocomposite films exhibit enhanced EMI shielding effectiveness, making them suitable for lightweight and low-cost EMI shielding applications in electronics, telecommunications, and aerospace industries.
研究不足
The study is limited to the X-band frequency regime (8–12 GHz) and does not explore other frequency ranges. The maximum h-BNNPs loading was 25 wt%, and the effects of higher loadings were not investigated.
1:Experimental Design and Method Selection:
The h-BNNPs/PVDF nanocomposite films were prepared via the simple solution casting approach using DMF as a solvent. The concentration of h-BNNPs in the PVDF matrix was varied from 0 to 25 wt%.
2:Sample Selection and Data Sources:
PVDF powder was supplied by Pragati Plastics Private Limited, India. h-BNNPs having an average particle size of ~ 70 nm and N, N-dimethylformamide (DMF) were procured from Sisco Research Laboratories (SRL) PVT. LTD, India.
3:List of Experimental Equipment and Materials:
Olympus BX-53 cross polarizing optical microscope (POM), Carl Zeiss EVO/18SH scanning electron microscope (SEM), Perkin Elmer differential scanning calorimeter (DSC-7), Wayne Kerr 6500B Precision Impedance Analyzer, 8510 C vector network analyzer (VNA).
4:Experimental Procedures and Operational Workflow:
The PVDF powder was dissolved completely in DMF at 60°C for ~ 4 hrs. The h-BNNPs were dispersed independently in DMF via ultrasonication for ~ 30 min. at room temperature. Later, the h-BNNPs/DMF dispersions were poured into the PVDF/DMF solutions and continuously stirred overnight to obtain uniform h-BNNPs/PVDF dispersion. The prepared dispersion was poured on to a Teflon Petri dish and dried in a hot air oven at 60°C for ~ 12 hrs in order to completely evaporate the solvent.
5:Data Analysis Methods:
The dispersion and the distribution of h-BNNPs in the PVDF matrix was evaluated using POM and SEM. The thermal analysis was conducted using DSC. The electrical properties were appraised using Wayne Kerr 6500B Precision Impedance Analyzer. The EMI SE of the h-BNNPs/PVDF nanocomposite films were studied using 8510 C vector network analyzer (VNA).
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Olympus BX-53 cross polarizing optical microscope
BX-53
Olympus
Evaluation of the dispersion and the distribution of h-BNNPs in the PVDF matrix
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Carl Zeiss EVO/18SH scanning electron microscope
EVO/18SH
Carl Zeiss
Study of the surface morphology of h-BNNPs/PVDF nanocomposite films
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Perkin Elmer differential scanning calorimeter
DSC-7
Perkin Elmer
Thermal analysis of h-BNNPs/PVDF nanocomposite films
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8510 C vector network analyzer
8510 C
Agilent Technologies
Study of the EMI SE of the h-BNNPs/PVDF nanocomposite films
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Wayne Kerr 6500B Precision Impedance Analyzer
6500B
Wayne Kerr
Appraisal of the electrical properties of h-BNNPs/PVDF nanocomposite films
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