研究目的
To develop a facile mix-thermal strategy to prepare carbon black-modified graphitic carbon nitrides for improved photocatalytic activities under visible light irradiation.
研究成果
The carbon black-modified graphitic carbon nitride with unique physicochemical features produced through a facile process has a promising application in energy conversion and environmental remediation.
研究不足
The study focuses on the modification of graphitic carbon nitride with carbon black and its photocatalytic performance under visible light, but does not explore other potential dopants or photocatalytic conditions.
1:Experimental Design and Method Selection:
A mix-thermal strategy was used to prepare carbon black-modified graphitic carbon nitrides.
2:Sample Selection and Data Sources:
Urea and carbon black were used as precursors.
3:List of Experimental Equipment and Materials:
Shimadzu diffractometer, VERTEX 80/80 v FTIR spectrometer, Kratos Axis ULTRA X-ray photoelectron spectrometer, JEOL JEM-1010 TEM, Philips Tecnai F20 FEG-S/TEM, Micromeritics TriStar II 3020, Shimadzu DTG-60A analyzer, Shimadzu UV-2600 spectrometer, FLS 920 photoluminescence spectrometer.
4:Experimental Procedures and Operational Workflow:
The mixture of urea and carbon black was heated at 550 °C for 3 h. The products were characterized by XRD, FTIR, XPS, TEM, BET, TG-DSC, DRS, PL, and EIS.
5:Data Analysis Methods:
The photocatalytic activities were evaluated by monitoring the degradation of methylene blue and Orange II sodium salt solution under visible light irradiation.
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UV-visible spectrometer
Shimadzu UV-2600
Shimadzu
Measuring DRS
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Photoluminescence spectrometer
FLS 920
Edinburgh Instruments
Obtaining fluorescence spectra
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Shimadzu diffractometer
XRD-6000
Shimadzu
Analyzing XRD patterns
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FTIR spectrometer
VERTEX 80/80 v
Bruker
Recording FTIR spectra
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Transmission electron microscope
JEOL JEM-1010
JEOL
Taking TEM images
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Thermal analyzer
Shimadzu DTG-60A
Shimadzu
Obtaining TG-DSC data
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X-ray photoelectron spectrometer
Kratos Axis ULTRA
Kratos Analytical
Measuring surface chemical states
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Analytical transmission electron microscope
Philips Tecnai F20 FEG-S/TEM
Philips
Obtaining HRTEM images and SAED patterns
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Surface area analyzer
Micromeritics TriStar II 3020
Micromeritics
Calculating SSA and pore volumes
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Electrochemical impedance spectrometer
Measuring EIS
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