研究目的
To develop precise dynamical models of wide bandgap power semiconductor devices, their packages, and circuit wiring for simulating fast switching behavior, including the extraction of model parameters and characterization of static and dynamic conditions.
研究成果
The paper concludes that precise modeling of wide bandgap power semiconductor devices, including static I-V characteristics, parasitic terminal capacitance, and wiring inductance, is essential for simulating transient behaviors in switching operations. The developed models and parameter extraction systems provide a foundation for analyzing power conversion circuits, though further refinement is needed for complete accuracy.
研究不足
The physics-based model does not completely correspond with actual device behavior due to non-ideality of device characteristics. Further study for semi-empirical device model is required for accurate modeling.
1:Experimental Design and Method Selection:
The study employs physics-based modeling for power semiconductor devices, focusing on static and dynamic characteristics.
2:Sample Selection and Data Sources:
SiC Schottky barrier diode (SBD) and SiC MOSFET are used as samples, with their characteristics measured using curve tracers and impedance analyzers.
3:List of Experimental Equipment and Materials:
Includes curve tracer (Agilent 1505B), impedance analyzer (Agilent 4294A), parameter analyzer with high voltage bias T (Keithley 4200-SCS), and specific power devices (SCT2080KE, SCH2080KE).
4:Experimental Procedures and Operational Workflow:
Static I-V and C-V characteristics are measured, followed by dynamic behavior evaluation in a power conversion circuit with inductive load.
5:Data Analysis Methods:
Parameters are extracted from measured I-V and C-V characteristics for model simulation, comparing experimental and simulated transient behaviors.
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