研究目的
To develop a safer, simpler, and more controllable method to synthesize inverse opal TiO2-x photonic crystals (IO-TiO2-x) with improved photoelectric properties.
研究成果
The two-step calcination method successfully synthesized IO-TiO2-x with controlled reduction degrees and structures. The materials exhibited enhanced photoelectric properties due to the introduction of reduced Ti atoms/oxygen vacancies and the 3D-ordered macroporous inverse opal structure. This method offers a safe, controllable, and efficient approach to producing high-performance TiO2 materials for photoelectric applications.
研究不足
The study does not address the scalability of the synthesis method for industrial applications. The long-term stability under operational conditions was not extensively tested.
1:Experimental Design and Method Selection:
A two-step calcination process was employed to synthesize IO-TiO2-x. The first step involved the formation of opal photonic crystal templates using polystyrene (PS) spheres, followed by the absorption of TiO2 precursor into the gaps. The second step involved calcination in the presence of dicyandiamide (DCDA) to introduce reduced Ti atoms/oxygen vacancies.
2:Sample Selection and Data Sources:
Monodispersed PS spheres were synthesized and used as templates. TiO2 precursor was prepared using titanium tetraisopropanolate (TTIP).
3:List of Experimental Equipment and Materials:
PS spheres, TTIP, DCDA, and various characterization tools including TEM, FESEM, XRD, EPR, Raman, XPS, UV-DRS, and PL spectroscopy.
4:Experimental Procedures and Operational Workflow:
The synthesis involved the preparation of PS opal templates, infiltration with TiO2 precursor, calcination to remove the template and form IO-TiO2, and a second calcination with DCDA to produce IO-TiO2-x.
5:Data Analysis Methods:
Characterization techniques were used to analyze the structure, composition, and photoelectric properties of the synthesized materials.
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Electrochemical analyzer
CHI 660 D
CHI Instruments Inc.
Electrochemical experiments
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Transmission electron microscope
JEM-2100
JEOL
Characterization of sample morphology
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Field emission scanning electron microscopy
Nova Nano-SEM 450
Characterization of sample morphology
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X-ray diffraction meter
Rigaku Ultima IV
Determination of phase composition
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EPR spectrometer
Bruker EMX 8/2.7
Detection of unpaired electrons
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X-ray photoelectron spectroscopy
Perkin-Elmer PHI 5000C ESCA
Study of chemical nature of samples
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UV-vis diffuse reflectance spectroscope
SHIMADZU UV-2600
Measurement of UV-DRS
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Luminescence spectrometry
Cary Eclipse
Measurement of PL emission spectra
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Raman microprobe system
Renishaw inVia-Reflex
Recording of Raman spectra
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