研究目的
To develop efficient and stable new semiconductor photocatalysts to degrade organic pollutants and produce clean energy.
研究成果
CdS QDs modified CdIn2S4/CdWO4 composites show excellent photocatalytic performance under multi-mode conditions, with enhanced light absorption and efficient electron transfer capabilities. The composites demonstrate significant potential for degrading organic pollutants and producing hydrogen from water under visible light.
研究不足
The study focuses on the synthesis and characterization of CdS QDs@CdIn2S4/CdWO4 nanocomposites and their photocatalytic performance under specific conditions. The scalability and long-term stability of the photocatalyst in practical applications are not addressed.
1:Experimental Design and Method Selection:
Microwave-assisted hydrothermal method was employed for the synthesis of CdS QDs@CdIn2S4/CdWO4 nanocomposites.
2:Sample Selection and Data Sources:
Cadmium acetate, thiourea, sodium tungstate, indium nitrate, and mercaptopropionic acid were used as precursors.
3:List of Experimental Equipment and Materials:
X-ray diffractometer (Bruker-AXS D8), X-ray photoelectron spectrometer (VG-ADES400), scanning electron microscope (Hitachi S-4700), TEM and HR-TEM (Hitachi H-7650 and JEM-2100F), UV-Vis spectrophotometer (TU-1901), fluorescence spectrophotometer (Hitachi F-7000).
4:0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Precursor solutions were prepared, mixed, and subjected to microwave irradiation. The products were characterized and tested for photocatalytic activity.
5:Data Analysis Methods:
XRD, XPS, SEM, TEM, UV-Vis DRS, PL spectroscopy, and N2 adsorption-desorption isotherms were used for analysis.
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X-ray diffractometer
D8
Bruker-AXS
Analyzing the crystal structure of the samples
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Scanning electron microscope
S-4700
Hitachi
SEM analysis of the sample
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TEM
H-7650
Hitachi
TEM analysis of the samples
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HR-TEM
JEM-2100F
JEOL
HR-TEM analysis of the samples
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X-ray photoelectron spectrometer
VG-ADES400
Measuring XPS spectra
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UV-Vis spectrophotometer
TU-1901
Beijing General Analysis Corporation
UV-Vis diffuse reflectance spectroscopy tests
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Fluorescence spectrophotometer
F-7000
Hitachi High-Tech Science and Technology, Ltd.
Measuring PL spectrum
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