研究目的
To investigate the optical and mechanical properties of Sol-gel prepared Titania (TiO2)–Silica (SiO2) mixed thin films 'as prepared at 300 K' without any post heat treatment.
研究成果
The TiO2–SiO2 mixed metal oxide thin films prepared at 300 K without any post heat treatment exhibit interesting optical and mechanical properties, including high optical transparency and enhanced mechanical hardness. The presence of multiple phases of Ti–O–Si contributes to the observed properties, suggesting potential applications in various fields.
研究不足
The study is limited to the evaluation of optical and mechanical properties of 'as-deposited' thin films without any post heat treatment. The reproducibility of the microstructure and physical properties without post deposition treatments may be challenging.
1:Experimental Design and Method Selection:
The study involves the preparation of TiO2–SiO2 thin films using sol-gel technology at 300 K without any post heat treatment. The films are prepared by dip coating on glass substrates.
2:Sample Selection and Data Sources:
Individual sols of TiO2 and SiO2 of 0.1 molar (TS-1) and 0.3 molar (TS-3) concentrations are prepared and mixed in fixed volumes to obtain the mixed sol of titania-silica (TS).
3:1 molar (TS-1) and 3 molar (TS-3) concentrations are prepared and mixed in fixed volumes to obtain the mixed sol of titania-silica (TS). List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Includes reagent-grade titanium tetraisopropoxide (TTIP), tetraethoxyorthosilicate (TEOS), HCl, and ethanol for sol preparation. A commercial microprocessor controlled dip-coater is used for thin film preparation.
4:Experimental Procedures and Operational Workflow:
The sols are prepared by adding TTIP and TEOS to ethanol with continuous stirring, followed by the addition of diluted HCl to monitor the pH. The mixed sols are aged for 24 h at 300 K before dip coating.
5:Data Analysis Methods:
The optical and mechanical properties of the thin films are evaluated using various characterization techniques including optical reflectance measurements, Raman spectroscopy, and mechanical hardness tests.
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titanium tetraisopropoxide
TTIP
Spectrochem
Precursor for TiO2 sol preparation
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tetraethoxyorthosilicate
TEOS
Sigma Aldrich
Precursor for SiO2 sol preparation
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HCl
Merck
Catalyst for sol preparation
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ethanol
Merck
Solvent for sol preparation
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dip-coater
Preparation of thin films by dip coating
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optical reflectance measurements
Filmetrics F-20
Measurement of thickness, refractive index and extinction coefficients of thin films
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Surface Profilometer
Bruker Contour GT In-Motion
Evaluation of root mean square (rms) surface roughness of thin films
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UV–vis spectrophotometer
Cary 60
Optical transmission measurements
Cary 60 UV-Vis Spectrophotometer
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Raman Spectrometer
Horiba Jobin Yvon LabRam HR Evolution
Collection of Raman spectra
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Field-Emission SEM
FEI Inspect F50
Recording SEM micrographs
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scratch-tester
CSM, Revetest
Measurement of mechanical adhesion and hardness of deposited films
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nano hardness tester
Measurement of hardness of thin films
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