研究目的
To develop a cost-effective and efficient method for the exfoliation of layered materials like transition metal dichalcogenides into mono- or few-layers for various applications.
研究成果
Few-layered MoS2 was successfully prepared from natural SiO2-containing molybdenite by exfoliation in IPA under mild ultrasonic conditions. The quartz phase associated in molybdenite plays a crucial role in the effective exfoliation, acting as superfine ball milling. This method provides a cost-effective and convenient solution for the large-scale production of few-layered MoS2, appealing for industrial applications.
研究不足
The study highlights the influence of solvents on the morphology of the product, which is poorly understood at present. Further research is needed to fully elucidate the underlying exfoliation mechanisms.
1:Experimental Design and Method Selection:
The study involved the preparation of few-layered MoS2 from natural SiO2-containing molybdenite by exfoliation in isopropanol (IPA) under mild ultrasonic conditions.
2:Sample Selection and Data Sources:
Natural molybdenite (NM) was collected and enriched in Dasuji diggings, Zhuozi County, Inner Mongolia. Commercial MoS2 (CM) was bought from Sigma-Aldrich.
3:List of Experimental Equipment and Materials:
Equipment included an ultrasonic water bath, X-ray fluorescence (XRF) spectrometer, inductively-coupled plasma-mass (ICP-MS) spectrometer, scanning electron microscope (SEM), X-ray diffraction (XRD), energy dispersive spectrometry (EDS), transmission electron microscopy (TEM), atomic force microscopy (AFM), and a CHI760E Chenhua electrochemical workstation. Materials included NMP, P123, and IPA.
4:Experimental Procedures and Operational Workflow:
The exfoliation process involved adding NM or CM to exfoliation solutions (IPA, NMP, or P123 aqueous solutions) and batch sonicating for 16 h. The resulting dispersion was centrifuged to remove thick nanosheets and excess impurity.
5:Data Analysis Methods:
The study used UV-vis spectra, XRD patterns, Raman spectra, SEM imaging, EDS, TEM imaging, AFM, and photoelectrochemical measurements to analyze the exfoliated MoS2.
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XRF spectrometer
Rigaku ZSX Primus II
Rigaku
Compositional analysis of natural molybdenite
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ICP-MS spectrometer
Thermo X Series II
Thermo
Determination of exact content of Mo, S, and SiO2 in natural molybdenite
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SEM
Hitachi S4800
Hitachi
Imaging of natural molybdenite and commercial MoS2
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XRD
PANalytical X’Pert Pro
PANalytical
Measurement of XRD patterns
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EDS
Bruker QUANTAX 200
Bruker
Energy dispersive X-ray analyses
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TEM
FEI Tecnai G2F20S-TWIN
FEI
Measurement of TEM images
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AFM
Dimension Icon
Bruker
Nanosheets thickness measurements
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Electrochemical workstation
CHI760E
Chenhua
Photoelectrochemical measurement
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Xe lamp
PLS-SXE300c
Beijing Trustech
Visible light irradiation source
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