摘要： Recent advancements in the commercialization of In-situ temperature dependent optical spectrophotometer have shown potential not only for the recording of optical absorption spectra but also towards the exploration of physical insights and the understanding of instrument handling. Measurement on the effect of the variation of temperature onto optical properties mainly for semi-conducting oxides helps to explore the functioning and play a crucial role towards the development of optoelectronic devices. Being a non-contact, non-destructive technique temperature dependent DRS Setup can be used as a primary tool for the in-situ characterization of optical properties. This appreciation prompts us to design and develop an instrument that can add the ability of in-situ temperature dependent DRS above room temperature. The setup, developed and reported here, is able to accurately characterize the samples from room temperature to 500 K, which is most suitable range for the characterization of semiconducting materials, which is in the heard of current materials’ research. The present study provides the economical alternatives to the existing designs used for this purpose without compromising on the reliability of the obtained data. The in-house developed set up is found to be efficiently used for the analysis of various properties of the samples and will open up the instrumental development and commercialization of the temperature dependent DRS technique.