研究目的
To study the effect of strain induced by metal contacts in graphene/hBN superlattice devices and to compare the strain patterns induced by two-dimensional (2D) top-contacts and one-dimensional (1D) edge-contacts.
研究成果
Top-contacts induce strain in graphene along two opposing leads, creating a complex strain pattern, while edge-contacts do not. Thermal annealing reduces doping and increases compressive strain, leading to a convergence of twist-angles in graphene/hBN superlattices for both contact types. This confirms the self-locking mechanism of graphene/hBN superlattices even in the presence of strain gradients.
研究不足
The study is limited to semi-encapsulated graphene/hBN devices without a top hBN layer, which may affect the strain and doping levels compared to fully encapsulated devices. The resolution of the experimental technique for strain measurement is approximately 0.005%.
1:Experimental Design and Method Selection:
Semi-encapsulated graphene/hBN Hall-bars were fabricated with two different types of contact geometry: 2D top-contacts and 1D edge-contacts. Raman spectroscopy mapping was used to determine the strain and doping levels.
2:Sample Selection and Data Sources:
A single flake of monolayer graphene on hBN was used to fabricate Hall-bar devices.
3:List of Experimental Equipment and Materials:
Electron beam lithography (Nano Beam NB5), PMMA (MicroChem 950K A6), Cr/Au (15/60 nm) for contacts, CHF3/O2 reactive-ion plasma for etching.
4:Experimental Procedures and Operational Workflow:
Devices were fabricated using electron beam lithography, metal deposition, and lift-off. Raman spectra were acquired using a 514 nm excitation CW solid-state laser.
5:Data Analysis Methods:
The frequency of the G and 2D modes of graphene were extracted using a Lorentzian fit to determine strain and doping levels.
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