研究目的

Investigating the core-levels of ZnO thin films at the interface with graphene/Cu using in-situ X-ray Photoelectron Spectroscopy (XPS) to understand the electron transfer at the interface and its impact on the electronic transport property of ZnO/graphene-based electronic devices.

研究成果

The study found that binding energies of Zn 2p3/2 and 'Zn?O' of O 1s change upon deposition time, indicating negligible interaction in ultrathin ZnO films and electron transfers from graphene/Cu substrate to ZnO films in thicker films, resulting in a dipole layer. This suggests enhanced interaction and atomic structure change in thicker ZnO films, which is important for electronic devices employing ZnO film on graphene.

研究不足

The study was limited to 6 minutes of deposition due to the attenuation of Cu 2p peak intensity, making it insufficient to determine its exact binding energy after 7 minutes. The interaction between ZnO and graphene/Cu substrate in thicker films and the exact nature of the atomic structure change require further investigation.